Abstract. We exploit the force spectroscopy capabilities of the atomic force microscope in characterizing the local elastic ity of rubber-like materials. Extraction of elastic properties from force curves usually relies on the linear theory pioneered by Hertz. While the Hertzian force-indentation relationships have been shown to be accurate in modeling the contact mechanics at sufficiently shallow indentation depths, the linear deformation regime of the probed material is exceeded in many practical applications of nanoindentation. In this article, a simple, nonlinear force-indentation equation based on the Mooney-Rivlin model is derived and used to fit data from the indentation of lightly crosslinked poly(vinyl alcohol) gels in equilibrium ...
AbstractWe address three problems that limit the use of the atomic force microscope when measuring e...
Soft, biphasic materials such as hydrogels are commonly used to mimic lubrication and confinement me...
The feasibility of using a Scanning Probe Microscope to measure nanomechanical properties of thin fi...
The analysis of mechanical properties on a nanometer scale is a useful tool for combining informatio...
AFM nanoindentations show a dependence of penetration, i.e., the relative motion between the sample ...
We propose a nanoindentation technique based on atomic force microscopy (AFM) that allows one to ded...
In this study, nanomechanical properties of a variety of polymeric materials was investigated by mea...
The Atomic Force Microscope (AFM), apart form its conventional use as a microscope, is also used for...
A new method to determine the elastic modulus of a material using the atomic force microscope (AFM) ...
The elastic moduli of a range of polymers were characterized by nanoindentation on an atomic force m...
Atomic force microscopy (AFM) measurements were done on aqueous gelatin gels submerged in dodecane. ...
Nanoindentation is a popular experimental technique for characterization of the mechanical propertie...
Nanoindentation is a popular experimental technique for characterization of the mechanical propertie...
A method is proposed for quantitatively measuring the elastic modulus of materials using atomic forc...
AbstractElastic modulus of commonly used excipient, i.e. microcrystalline cellulose (MCC) and an act...
AbstractWe address three problems that limit the use of the atomic force microscope when measuring e...
Soft, biphasic materials such as hydrogels are commonly used to mimic lubrication and confinement me...
The feasibility of using a Scanning Probe Microscope to measure nanomechanical properties of thin fi...
The analysis of mechanical properties on a nanometer scale is a useful tool for combining informatio...
AFM nanoindentations show a dependence of penetration, i.e., the relative motion between the sample ...
We propose a nanoindentation technique based on atomic force microscopy (AFM) that allows one to ded...
In this study, nanomechanical properties of a variety of polymeric materials was investigated by mea...
The Atomic Force Microscope (AFM), apart form its conventional use as a microscope, is also used for...
A new method to determine the elastic modulus of a material using the atomic force microscope (AFM) ...
The elastic moduli of a range of polymers were characterized by nanoindentation on an atomic force m...
Atomic force microscopy (AFM) measurements were done on aqueous gelatin gels submerged in dodecane. ...
Nanoindentation is a popular experimental technique for characterization of the mechanical propertie...
Nanoindentation is a popular experimental technique for characterization of the mechanical propertie...
A method is proposed for quantitatively measuring the elastic modulus of materials using atomic forc...
AbstractElastic modulus of commonly used excipient, i.e. microcrystalline cellulose (MCC) and an act...
AbstractWe address three problems that limit the use of the atomic force microscope when measuring e...
Soft, biphasic materials such as hydrogels are commonly used to mimic lubrication and confinement me...
The feasibility of using a Scanning Probe Microscope to measure nanomechanical properties of thin fi...