Abstract—Manufacturing and environmental variations cause timing errors in microelectronic processors that are typically avoided by ultra-conservative multi-corner design margins or corrected by error detection and recovery mechanisms at the circuit-level. In contrast, we present here runtime software sup-port for cost-effective countermeasures against hardware timing failures during system operation. We propose a variability-aware OpenMP (VOMP) programming environment, suitable for tightly-coupled shared memory processor clusters, that relies upon modeling across the hardware/software interface. VOMP is implemented as an extension to the OpenMP v3.0 programming model that covers various parallel constructs, including,, and. Using the notio...
With the development of Very-Deep Sub-Micron technologies, process variability is becoming increasin...
We propose a tightly-coupled, multi-core cluster architecture with shared, variation-tolerant, and a...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
Manufacturing and environmental variations cause timing errors in microelectronic processors that ar...
We present a variation-tolerant tasking technique for tightly-coupled shared memory processor cluste...
Manufacturing and environmental variations cause timing errors that are typically avoided by conserv...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
It is getting increasingly difficult to verify processors and guarantee subsequent reliable operatio...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Microelectronic scaling has entered into the nanoscale era with tremendous capacity and performance ...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Continuous scaling of transistor feature size rapidly increases the effect of intermittent faults. T...
One of the challenges faced today in the design of microprocessors is to obtain power, performance s...
Shrinking of device dimensions has undoubtedly enabled the very large scale integration of transisto...
With the development of Very-Deep Sub-Micron technologies, process variability is becoming increasin...
We propose a tightly-coupled, multi-core cluster architecture with shared, variation-tolerant, and a...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
Manufacturing and environmental variations cause timing errors in microelectronic processors that ar...
We present a variation-tolerant tasking technique for tightly-coupled shared memory processor cluste...
Manufacturing and environmental variations cause timing errors that are typically avoided by conserv...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
It is getting increasingly difficult to verify processors and guarantee subsequent reliable operatio...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Microelectronic scaling has entered into the nanoscale era with tremendous capacity and performance ...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Continuous scaling of transistor feature size rapidly increases the effect of intermittent faults. T...
One of the challenges faced today in the design of microprocessors is to obtain power, performance s...
Shrinking of device dimensions has undoubtedly enabled the very large scale integration of transisto...
With the development of Very-Deep Sub-Micron technologies, process variability is becoming increasin...
We propose a tightly-coupled, multi-core cluster architecture with shared, variation-tolerant, and a...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...