Abstract--In diagnostic testing faults detectable by test vectors are partitioned into groups. This partitioning is such that a fault is distinguishable from faults in all other groups, but is indistinguishable from those in its own group. Diagnostic fault coverage (DC) is defined as the number of fault groups divided by the total number of faults. We present a new diagnostic fault simulation algorithm that determines the DC of given test vectors and produces a fault dictionary. For each vector, we begin with detected fault list at each primary output obtained from a convetional fault simulator. For the vector being simulated each fault is assigned a detection index that uniquely specifies its detection status at all primary outputs. Fault ...
This dissertation describes a new simulation technique for an automatic test generation system, SCIR...
Abstract: Model-based Fault Detection and Isolation (FDI) systems rely on a model of a real-world sy...
In this thesis, we develop effective techniques for system fault modeling and multiple fault diagnos...
To explore the potential speedup to be obtained through parallelism, a mathematical model for the pe...
Fault simulators are used extensively in the design of electronic circuits for both testing and faul...
Abstract: Recently, a framework describing the space of all fault models has been established. Subse...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
We describe a simulation-based test generation procedure for scan designs. A test sequence generated...
This paper introduces the concept of algorithmic redundancy used in fault diagnosis. Its implementat...
Diagnosis is an important but difficult problem in the design and manufacturing of VLSI circuits. Th...
Abstract: The paper describes a novel framework for using causal models in distributed fault diagnos...
Fault diagnosis forms an essential component in the design of highly reliable distributed computing...
We present an improved procedure for fault simulation under the multiple observation time approach b...
Abstract—In this paper, we propose a new symbolic simulation for scan chain diagnosis to solve the d...
Abstract: The fault coverage obtained by a set of test patterns is usually determined by expensive f...
This dissertation describes a new simulation technique for an automatic test generation system, SCIR...
Abstract: Model-based Fault Detection and Isolation (FDI) systems rely on a model of a real-world sy...
In this thesis, we develop effective techniques for system fault modeling and multiple fault diagnos...
To explore the potential speedup to be obtained through parallelism, a mathematical model for the pe...
Fault simulators are used extensively in the design of electronic circuits for both testing and faul...
Abstract: Recently, a framework describing the space of all fault models has been established. Subse...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
We describe a simulation-based test generation procedure for scan designs. A test sequence generated...
This paper introduces the concept of algorithmic redundancy used in fault diagnosis. Its implementat...
Diagnosis is an important but difficult problem in the design and manufacturing of VLSI circuits. Th...
Abstract: The paper describes a novel framework for using causal models in distributed fault diagnos...
Fault diagnosis forms an essential component in the design of highly reliable distributed computing...
We present an improved procedure for fault simulation under the multiple observation time approach b...
Abstract—In this paper, we propose a new symbolic simulation for scan chain diagnosis to solve the d...
Abstract: The fault coverage obtained by a set of test patterns is usually determined by expensive f...
This dissertation describes a new simulation technique for an automatic test generation system, SCIR...
Abstract: Model-based Fault Detection and Isolation (FDI) systems rely on a model of a real-world sy...
In this thesis, we develop effective techniques for system fault modeling and multiple fault diagnos...