Abstract: Redundancy based hardening techniques are applied at the pre-synthesis or synthesis level. To provide solutions for increasing the fault-tolerance capabilities with algorithms able to reduce sensitive configuration memory bits of FPGAs we use BIST method. While these systems frequently contain hardware redundancy to allow for continued operation in the presence of operational faults, the need to recover faulty hardware and return it to full functionality quickly and efficiently is great. In addition to providing functional density, FPGAs provide a level of fault tolerance generally not found in mask-programmable devices by including the capability to reconfigure around operational faults in the field. Reliability and process varia...
Field programmable gate arrays (FPGAs) are integrated circuits (ICs) designed to implement, or be p...
As field programmable gate arrays find increasing use in aerospace and terrestrial applications, a n...
Abstract:- Widespread reliability challenges are expected for 65nm and below VLSI fabrication techno...
Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to ...
Modern Field Programmable Gate Arrays (FPGAs) posses small feature sizes, and have gained popular...
Scaling of transistor's channel length is entering the realm of atomic and molecular geometries maki...
This paper presents a new approach to on-line fault tolerance via reconfiguration for the systems ma...
A wide range of fault tolerance methods for FPGAs have been proposed. Approaches range from simple a...
In the thesis, a methodology alternative to existing methods of digital systems design with increase...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
The new generations of SRAM-based FPGA (Field Programmable Gate Array) devices, built on nanometre t...
The new generations of SRAM-based FPGA (Field Programmable Gate Array) devices, built on nanometre t...
Mission-critical applications such as space or avionics increasingly demand high fault tolerance cap...
Field programmable gate arrays (FPGAs) are integrated circuits (ICs) designed to implement, or be pr...
Field programmable gate arrays (FPGAs) are integrated circuits (ICs) designed to implement, or be p...
As field programmable gate arrays find increasing use in aerospace and terrestrial applications, a n...
Abstract:- Widespread reliability challenges are expected for 65nm and below VLSI fabrication techno...
Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to ...
Modern Field Programmable Gate Arrays (FPGAs) posses small feature sizes, and have gained popular...
Scaling of transistor's channel length is entering the realm of atomic and molecular geometries maki...
This paper presents a new approach to on-line fault tolerance via reconfiguration for the systems ma...
A wide range of fault tolerance methods for FPGAs have been proposed. Approaches range from simple a...
In the thesis, a methodology alternative to existing methods of digital systems design with increase...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
The new generations of SRAM-based FPGA (Field Programmable Gate Array) devices, built on nanometre t...
The new generations of SRAM-based FPGA (Field Programmable Gate Array) devices, built on nanometre t...
Mission-critical applications such as space or avionics increasingly demand high fault tolerance cap...
Field programmable gate arrays (FPGAs) are integrated circuits (ICs) designed to implement, or be pr...
Field programmable gate arrays (FPGAs) are integrated circuits (ICs) designed to implement, or be p...
As field programmable gate arrays find increasing use in aerospace and terrestrial applications, a n...
Abstract:- Widespread reliability challenges are expected for 65nm and below VLSI fabrication techno...