A new algorithm to determine the number and value of realistic worst-case models for the performance of module library components is presented in this paper. The proposed algorithm employs Principal Components Analysis (PCA) at the performance level to identify the main independent sources of variance for the performance of a set of library modules. Response Surfaces Methodology (RSM) and Propagation Of Variance (POV) based algorithms are used to efficiently compute the performance level covariance matrix and non-linear maximum likelihood optimization to trace back worst case models at the SPICE level. The effec-tiveness of the proposed methodology has been demon-strated by determining a realistic set of worst case models for a 0.25µm CMOS ...
The performance of the defect prediction is solely based on the dataset which consist of software me...
Statistical variability is a major challenge for CMOS scaling and integration. In order to achieve v...
Abstract. Principal Component Analysis (PCA) is an im-portant concept in statistical signal processi...
A new algorithm to determine the number and value of realistic worst-case models for the performance...
This paper presents a methodology for statistical worst-case simulation using the BSIM3v3 model with...
The impact of process fluctuations on the variability of deep sub-micron (DSM) VLSI circuit performa...
The impact of process fluctuations on the variability of deep submicron (DSM) very large scale integ...
A practical and efficient approach for estimating the MOSFET device and circuit performance distribu...
A practical and efficient approach for estimating the MOSFET device and circuit performance distribu...
Abstract In this work, a new approach for the statistical worst case of full-chip circuit performanc...
Integrated circuits have to be robust to manufacturing variations. This paper presents a new statist...
This paper will describe the process by which realistic nominal and worst-case DC MOSFET model param...
Nowadays the highest device integration affects the design process in several ways. The process vari...
Abstract:- In this paper, the authors intend to show how to apply the circuit description in paramet...
Due to the character of the original source materials and the nature of batch digitization, quality ...
The performance of the defect prediction is solely based on the dataset which consist of software me...
Statistical variability is a major challenge for CMOS scaling and integration. In order to achieve v...
Abstract. Principal Component Analysis (PCA) is an im-portant concept in statistical signal processi...
A new algorithm to determine the number and value of realistic worst-case models for the performance...
This paper presents a methodology for statistical worst-case simulation using the BSIM3v3 model with...
The impact of process fluctuations on the variability of deep sub-micron (DSM) VLSI circuit performa...
The impact of process fluctuations on the variability of deep submicron (DSM) very large scale integ...
A practical and efficient approach for estimating the MOSFET device and circuit performance distribu...
A practical and efficient approach for estimating the MOSFET device and circuit performance distribu...
Abstract In this work, a new approach for the statistical worst case of full-chip circuit performanc...
Integrated circuits have to be robust to manufacturing variations. This paper presents a new statist...
This paper will describe the process by which realistic nominal and worst-case DC MOSFET model param...
Nowadays the highest device integration affects the design process in several ways. The process vari...
Abstract:- In this paper, the authors intend to show how to apply the circuit description in paramet...
Due to the character of the original source materials and the nature of batch digitization, quality ...
The performance of the defect prediction is solely based on the dataset which consist of software me...
Statistical variability is a major challenge for CMOS scaling and integration. In order to achieve v...
Abstract. Principal Component Analysis (PCA) is an im-portant concept in statistical signal processi...