Mathematical Subject Classification: 46N10 Abstract: This paper investigates optimal plans of accelerated life tests (ALT) for exponentially distributed lifetimes under progressive Type I interval censoring with random removals. For dierent combinations of total number of inspections and removal probability, we search for the optimal ALT plans which minimize the asymptotic variance of the estimated mean. Sensitivity analysis on the asymptotic variance of the estimated mean is also conducted to assess the robustness of the results with respect to the given parameters. Finally, suggestions are given to experimenters in designing an ALT under progressive Type I interval censoring with random removals
[[abstract]]Accelerated life testing of products is used to get information quickly on their lifetim...
In this article, we discuss the optimal and robust designs for accelerated life testing (ALT) when a...
[[abstract]]In this article, we investigate the optimization problem when the competing risks data c...
[[abstract]]In this paper, we investigate some inference and design problems related to multiple con...
We consider an optimization design for the alpha power exponential (APE) distribution as asymmetrica...
[[abstract]]The optimal design of a k-level step-stress accelerated life-testing (ALT) experiment wi...
[[abstract]]Some traditional life tests result in no or very few failures by the end of test. In suc...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
In this paper, we discuss the optimal accelerated life test plans for Burr type X distribution with ...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
[[abstract]]This article discusses a life test under progressive type-I group-censoring. We use maxi...
[[abstract]]In this paper, we determine optimally spaced inspection times for the two-parameter logn...
Published online: 22 Oct 2012. NSC 99-2118-M-032-011-MY3[[abstract]]We consider in this work a k-lev...
This paper provides methods of obtaining Bayesian D-optimal Accelerated Life Test (ALT) plans for se...
Accelerated Life Testing (ALT) is an efficient approach to obtain failure observations by subjecting...
[[abstract]]Accelerated life testing of products is used to get information quickly on their lifetim...
In this article, we discuss the optimal and robust designs for accelerated life testing (ALT) when a...
[[abstract]]In this article, we investigate the optimization problem when the competing risks data c...
[[abstract]]In this paper, we investigate some inference and design problems related to multiple con...
We consider an optimization design for the alpha power exponential (APE) distribution as asymmetrica...
[[abstract]]The optimal design of a k-level step-stress accelerated life-testing (ALT) experiment wi...
[[abstract]]Some traditional life tests result in no or very few failures by the end of test. In suc...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
In this paper, we discuss the optimal accelerated life test plans for Burr type X distribution with ...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
[[abstract]]This article discusses a life test under progressive type-I group-censoring. We use maxi...
[[abstract]]In this paper, we determine optimally spaced inspection times for the two-parameter logn...
Published online: 22 Oct 2012. NSC 99-2118-M-032-011-MY3[[abstract]]We consider in this work a k-lev...
This paper provides methods of obtaining Bayesian D-optimal Accelerated Life Test (ALT) plans for se...
Accelerated Life Testing (ALT) is an efficient approach to obtain failure observations by subjecting...
[[abstract]]Accelerated life testing of products is used to get information quickly on their lifetim...
In this article, we discuss the optimal and robust designs for accelerated life testing (ALT) when a...
[[abstract]]In this article, we investigate the optimization problem when the competing risks data c...