Add to ORKGThe lack of information about core’s internal structure is The designers must rely solely on the test set distributed by the core provider. Sometimes the stuck at fault (SAF) model and automatic test pattern generation (ATPG) are used to generate test vectors for those pre-defined blocks. However, a SAF test set could waste lots of time to verify the pre-verified internal structure of the cores. There-fore, in order to reduce the core-based design ver-ification time, we should adopt the connectivity-based port order fault (POF) model instead of the stuck at fault model. In this paper, we compare the POF model with the SAF model and propose a method that the POF test set for functional veri-fication can be generated by using the SAF-based AT...
This paper copes with the test-pattern generation and fault coverage determination in the core based...
modules and PCBs detects and diagnoses the exis-tence of physical defects on an interconnect network...
Test of electronic circuits for fabrication fault is important if the circuits should have reasonabl...
[[abstract]]Embedded cores are being increasingly used in the designs of large system-on-a-chip (SoC...
Abstract—Embedded cores are being increasingly used in the designs of large system-on-a-chip (SoC). ...
[[abstract]]Embedded cores are being increasingly used in the design of large system-on-a chip (SoC)...
[[abstract]]Embedded cores are being increasingly used in the design of large system-on-a-chip (SoC)...
[[abstract]]Embedded cores are being increasingly used in the design of large System-on-a-Chip (SoC)...
As the complexity of current hardware systems rises, it is challenging to harden these systems again...
Abstract—As the complexity of current hardware systems rises, it is challenging to harden these syst...
Many high-level fault models have been proposed in the past to perform verification at functional le...
Many high-level fault models have been proposed in the past to perform verification at functional le...
Functional design verification is one of the most serious bottlenecks in modem microprocessor design...
[[abstract]]In a system-on-a-chip (SOC) design, several to hundreds of design blocks or intellectual...
ISBN: 0818687045We propose a new approach to generate diagnostic tests and localize single gate desi...
This paper copes with the test-pattern generation and fault coverage determination in the core based...
modules and PCBs detects and diagnoses the exis-tence of physical defects on an interconnect network...
Test of electronic circuits for fabrication fault is important if the circuits should have reasonabl...
[[abstract]]Embedded cores are being increasingly used in the designs of large system-on-a-chip (SoC...
Abstract—Embedded cores are being increasingly used in the designs of large system-on-a-chip (SoC). ...
[[abstract]]Embedded cores are being increasingly used in the design of large system-on-a chip (SoC)...
[[abstract]]Embedded cores are being increasingly used in the design of large system-on-a-chip (SoC)...
[[abstract]]Embedded cores are being increasingly used in the design of large System-on-a-Chip (SoC)...
As the complexity of current hardware systems rises, it is challenging to harden these systems again...
Abstract—As the complexity of current hardware systems rises, it is challenging to harden these syst...
Many high-level fault models have been proposed in the past to perform verification at functional le...
Many high-level fault models have been proposed in the past to perform verification at functional le...
Functional design verification is one of the most serious bottlenecks in modem microprocessor design...
[[abstract]]In a system-on-a-chip (SOC) design, several to hundreds of design blocks or intellectual...
ISBN: 0818687045We propose a new approach to generate diagnostic tests and localize single gate desi...
This paper copes with the test-pattern generation and fault coverage determination in the core based...
modules and PCBs detects and diagnoses the exis-tence of physical defects on an interconnect network...
Test of electronic circuits for fabrication fault is important if the circuits should have reasonabl...