Abstract- It is desirable to measure the hardness of individual grains and microconstituents to have control over the mechanical properties of materials. An ultra-micro or nanoindenter is required to make indents small enough to fit inside a single grain or phases that is smaller than 10 mm diameter. Because the indents are too small for an optical microscope an atomic force microscope was used to view the location and measure the contact area. Measuring the contact area of indents from an atomic force microscope image is unreliable because it is difficult to manually locate the indent edge. To solve this problem computerized image analysis software called NanoMc was used to measure the residual indent contact area. This software digitally ...
Investigation of the mechanical properties of materials at the nanoscale is often performed by atomi...
The feasibility of using a Scanning Probe Microscope to measure nanomechanical properties of thin fi...
An atomic force microscopy (AFM) based technique is proposed for the characterization of both indent...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
AFM nanoindentation is nowadays not so widespread for the study of mechanical properties of material...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
Abstract. Atomic force microscopy (AFM) nanoindentation is presently not that widespread for the stu...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
AFM nanoindentation is nowadays not so widespread for the study of mechanical properties of material...
International audienceIn the indentation test, the hardness and the elastic modulus depend strongly ...
International audienceIn the indentation test, the hardness and the elastic modulus depend strongly ...
International audienceIn the indentation test, the hardness and the elastic modulus depend strongly ...
Investigation of the mechanical properties of materials at the nanoscale is often performed by atomi...
The feasibility of using a Scanning Probe Microscope to measure nanomechanical properties of thin fi...
An atomic force microscopy (AFM) based technique is proposed for the characterization of both indent...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
AFM nanoindentation is nowadays not so widespread for the study of mechanical properties of material...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
Abstract. Atomic force microscopy (AFM) nanoindentation is presently not that widespread for the stu...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
AFM nanoindentation is nowadays not so widespread for the study of mechanical properties of material...
International audienceIn the indentation test, the hardness and the elastic modulus depend strongly ...
International audienceIn the indentation test, the hardness and the elastic modulus depend strongly ...
International audienceIn the indentation test, the hardness and the elastic modulus depend strongly ...
Investigation of the mechanical properties of materials at the nanoscale is often performed by atomi...
The feasibility of using a Scanning Probe Microscope to measure nanomechanical properties of thin fi...
An atomic force microscopy (AFM) based technique is proposed for the characterization of both indent...