Abstract; Particle formation has been investigated experimentally from the initial molecular precursors up to the final micron-sized particles in a low pressure silane rf capacitive discharge. Neutrals and ions were studied by quadrupole mass spectro-metry in power-modulated plasmas: Whole series of negative ions were observed, ranging from monosilicon anions through to nanometric clusters. Anion confinement results in particles and conversely, anion de-trapping can inhibit particle formation. Plasma polymerisation is considered in terms of neutral and ionic species. Laser light scattering measurements show that particles appear during a rapid coalescence phase and possible mechanisms are discussed. INTRODUCI'ION Particles during silan...
The growth of particles in a radiofrequency (RF) (13.56 MHz) plasma at pressures from 25 to 200 mTor...
Plasma processing contamination continues to affect device yield in the microelectronics industry. P...
Previous measurements of SixHm- anions and electrons in the afterglow of silane discharges are analy...
Partial-depth modulation of the rf power in a capacitive discharge is used to investigate the relati...
Measurements of anions and cations are reported for hydrocarbon and silane radio frequency capacitiv...
The different phases of the powder formation in RF (oxygen-)silane plasmas are discussed. Mass spect...
Negative ions have been clearly identified in silane rf plasmas used for the deposition of amorphous...
Plasmas are used extensively in the manufacturing of microelectronic devices. In typical fabrication...
Dust can be found anywhere: in the kitchen, in the car, in space… Not surprisingly we also see dust ...
Particle formation during low pressure SF6/argon etching of silicon in a single wafer parallel plate...
To determine self‐consistently the time evolution of particle size and their number density in situ ...
Micro-particle formation in low pressure silane (SiH4) plasmas has been of technical interest and co...
In this work we present an overview of our investigations on the particle formation in Silane plasma...
The formation of solid particles in the gas phase is a general problem for PECVD technology when loo...
The usage of low-cost silicon-based solar cells is limited by their tendency to degrade on prolonged...
The growth of particles in a radiofrequency (RF) (13.56 MHz) plasma at pressures from 25 to 200 mTor...
Plasma processing contamination continues to affect device yield in the microelectronics industry. P...
Previous measurements of SixHm- anions and electrons in the afterglow of silane discharges are analy...
Partial-depth modulation of the rf power in a capacitive discharge is used to investigate the relati...
Measurements of anions and cations are reported for hydrocarbon and silane radio frequency capacitiv...
The different phases of the powder formation in RF (oxygen-)silane plasmas are discussed. Mass spect...
Negative ions have been clearly identified in silane rf plasmas used for the deposition of amorphous...
Plasmas are used extensively in the manufacturing of microelectronic devices. In typical fabrication...
Dust can be found anywhere: in the kitchen, in the car, in space… Not surprisingly we also see dust ...
Particle formation during low pressure SF6/argon etching of silicon in a single wafer parallel plate...
To determine self‐consistently the time evolution of particle size and their number density in situ ...
Micro-particle formation in low pressure silane (SiH4) plasmas has been of technical interest and co...
In this work we present an overview of our investigations on the particle formation in Silane plasma...
The formation of solid particles in the gas phase is a general problem for PECVD technology when loo...
The usage of low-cost silicon-based solar cells is limited by their tendency to degrade on prolonged...
The growth of particles in a radiofrequency (RF) (13.56 MHz) plasma at pressures from 25 to 200 mTor...
Plasma processing contamination continues to affect device yield in the microelectronics industry. P...
Previous measurements of SixHm- anions and electrons in the afterglow of silane discharges are analy...