As integrated circuits are scaled down it becomes dif-ficult to maintain uniformity in process parameters across each individual die. The resulting performance variation requires new design strategies to avoid pessimistic over-design. A quantified understanding of the contribution dif-ferent circuit components make to performance variation is a necessary part of such strategies. This paper proposes a technique for quantifying variability in clock skew in FP-GAs based on a novel differential delay measurement cir-cuit. The technique is capable of isolating the effects on clock skew from different components in the clock network. Results from a 65nm FPGA show that clock skew variation is significant, being comparable in magnitude to signal pa...
Increased variation in CMOS processes due to scaling results in greater reliance on accurate variati...
In this paper we address both empirically and theoretically the impact of an advanced manufacturing ...
We report the design and characterization of a circuit technique to measure the on-chip delay of a...
In this paper, we analyze the impact of process variations on the clock skew of VLSI circuits design...
This thesis examines new timing measurement methods for self delay characterisation of Field-Program...
As processor clock frequencies become faster, architecture-level design is becoming increasingly lim...
Circuit variation is one of the biggest problems to overcome if Moore\u27s Law is to continue. It is...
Circuit variation is one of the biggest problems to overcome if Moore\u27s Law is to continue. It is...
Circuits implemented in FPGAs have delays that are dom-inated by its programmable interconnect. This...
The mitigation of process variability becomes paramount as chip fabrication advances deeper into the...
Abstract—As semiconductor manufacturing continues towards reduced feature sizes, yield loss due to p...
In this work, we analyze the impact of local process variations on the clock skew of VLSI circuits d...
Process variability is a challenging fabrication issue impacting, mainly, the reliability and perfor...
Abstract—Increased variation in CMOS processes due to scaling results in greater reliance on accurat...
This thesis examines new timing measurement methods for self delay characterisation of Field-Program...
Increased variation in CMOS processes due to scaling results in greater reliance on accurate variati...
In this paper we address both empirically and theoretically the impact of an advanced manufacturing ...
We report the design and characterization of a circuit technique to measure the on-chip delay of a...
In this paper, we analyze the impact of process variations on the clock skew of VLSI circuits design...
This thesis examines new timing measurement methods for self delay characterisation of Field-Program...
As processor clock frequencies become faster, architecture-level design is becoming increasingly lim...
Circuit variation is one of the biggest problems to overcome if Moore\u27s Law is to continue. It is...
Circuit variation is one of the biggest problems to overcome if Moore\u27s Law is to continue. It is...
Circuits implemented in FPGAs have delays that are dom-inated by its programmable interconnect. This...
The mitigation of process variability becomes paramount as chip fabrication advances deeper into the...
Abstract—As semiconductor manufacturing continues towards reduced feature sizes, yield loss due to p...
In this work, we analyze the impact of local process variations on the clock skew of VLSI circuits d...
Process variability is a challenging fabrication issue impacting, mainly, the reliability and perfor...
Abstract—Increased variation in CMOS processes due to scaling results in greater reliance on accurat...
This thesis examines new timing measurement methods for self delay characterisation of Field-Program...
Increased variation in CMOS processes due to scaling results in greater reliance on accurate variati...
In this paper we address both empirically and theoretically the impact of an advanced manufacturing ...
We report the design and characterization of a circuit technique to measure the on-chip delay of a...