COMPACT EMITTANCE SCANNERS FOR BEAMS*

Compact electric sweep emittance scanners have been previ-ously described for low energy ion beams. New scanners have recently been developed to operate in the MeV range without a significant increase in physical size. These scanners are suitable for the analysis of electron and ion beams. The scanners have excellent angular resolution despite their compact dimensions. Electrical and mechanical design and scaling parameters are presented. Operational experience with a 1 MeV, 25 mA, 50 KS H-beam is discussed