Add to ORKGThe imaging of crystal defects by high-resolution transmission electron microscopy or with the help of the electron diffraction contrast technique is well known and routinely used. However, a direct and phenomenological analysis of electron micrographs is mostly not possible, thus requiring the application of image simulation and matching techniques
We succesfully determined the 3D crystal structure of inorganic nano-crystalline material using fast...
A new technique that is independent of image contrast and robust to the presence of experimental noi...
Dislocations in crystalline materials have a strong impact on mechanical properties. As a result, id...
Two of the major applications of the high resolution transmission electron microscope (HRTEM) image-...
At present it is difficult to use direct image processing techniques to determine the specimen struc...
The limits of high resolution electron microscopy (HREM) applied to quantum-sized structures were in...
We have performed high-resolution transmission electron microscope image simulations to assess the ...
Computer simulation of electron micrographs is an invaluable aid in their proper interpretation and ...
As defects and impurities are present in all materials, High Resolution Transmission Electron Micros...
High resolution electron microscopy is now often used to determine the structure of nano‐materials: ...
High resolution transmission electron microscopy (HRTEM) has been extensively used as a structure ch...
Crystal damage induced by irradiation is investigated using transmission electron microscopy (TEM) c...
In order to clarify the limits of HREM observations of defects due to radiation damage, a simulation...
High-Resolution Electron Microscopy observations of gold particles are compared with images calculat...
High-resolution electron microscopy (HREM) images of silicalite (ZSM-5) along [010] were taken with ...
We succesfully determined the 3D crystal structure of inorganic nano-crystalline material using fast...
A new technique that is independent of image contrast and robust to the presence of experimental noi...
Dislocations in crystalline materials have a strong impact on mechanical properties. As a result, id...
Two of the major applications of the high resolution transmission electron microscope (HRTEM) image-...
At present it is difficult to use direct image processing techniques to determine the specimen struc...
The limits of high resolution electron microscopy (HREM) applied to quantum-sized structures were in...
We have performed high-resolution transmission electron microscope image simulations to assess the ...
Computer simulation of electron micrographs is an invaluable aid in their proper interpretation and ...
As defects and impurities are present in all materials, High Resolution Transmission Electron Micros...
High resolution electron microscopy is now often used to determine the structure of nano‐materials: ...
High resolution transmission electron microscopy (HRTEM) has been extensively used as a structure ch...
Crystal damage induced by irradiation is investigated using transmission electron microscopy (TEM) c...
In order to clarify the limits of HREM observations of defects due to radiation damage, a simulation...
High-Resolution Electron Microscopy observations of gold particles are compared with images calculat...
High-resolution electron microscopy (HREM) images of silicalite (ZSM-5) along [010] were taken with ...
We succesfully determined the 3D crystal structure of inorganic nano-crystalline material using fast...
A new technique that is independent of image contrast and robust to the presence of experimental noi...
Dislocations in crystalline materials have a strong impact on mechanical properties. As a result, id...