Electron energy-loss spectroscopy (EELS) is an efficient microanalytical technique for gaining chemical and structural information of thin samples with high trace element sensitivity. Although in principle possible, detecting single atoms [1], is not trivial. Estimating elemental detection limits or the minimum number of detectable atoms accurately requires a.) reliable signal extraction schemes, as the signal is often superimposed on a large background or overlaps with another edge, b.) a good estimation of the statistical uncertainty associated with background removal c.) accurately known ionization cross-sections and d.) a good understanding of the noise introduced by the spectrometer´s detector. In this paper systematic studies have bee...
This is an AAM - Author Accepted Manuscript of the article published by Elsevier B.V. in Ultramicros...
This thesis describes the results of an investigation into the design of a parallel recording system...
The detection and quantification of low energy, low level edges presents several problems for Electr...
Parallel-detection electron energy loss spectrometers are able to detect the EELS signal originating...
Simultaneous measurements have been made in the scanning transmission electron microscope to determi...
Simultaneous measurements have been made in the scanning transmission electron microscope to determi...
An overview of recent progress in high loss electron energy loss spectroscopy is presented. This cov...
Simultaneous measurements have been made in the scanning transmission electron microscope to determi...
An overview of recent progress in high loss electron energy loss spectroscopy is presented. This cov...
Electron energy-loss spectroscopy (EELS) is an analytical microscopy technique which measures the en...
An overview of recent progress in high loss electron energy loss spectroscopy is presented. This cov...
A method for spectral acquisition, called binned gain averaging, will be described and tested. Syste...
Electron energy-loss spectroscopy (EELS) is a technique that can give useful information on elementa...
Electron energy-loss spectroscopy (EELS) is a technique that can give useful information on elementa...
Electron energy-loss spectroscopy (EELS) is a technique that can give useful information on elementa...
This is an AAM - Author Accepted Manuscript of the article published by Elsevier B.V. in Ultramicros...
This thesis describes the results of an investigation into the design of a parallel recording system...
The detection and quantification of low energy, low level edges presents several problems for Electr...
Parallel-detection electron energy loss spectrometers are able to detect the EELS signal originating...
Simultaneous measurements have been made in the scanning transmission electron microscope to determi...
Simultaneous measurements have been made in the scanning transmission electron microscope to determi...
An overview of recent progress in high loss electron energy loss spectroscopy is presented. This cov...
Simultaneous measurements have been made in the scanning transmission electron microscope to determi...
An overview of recent progress in high loss electron energy loss spectroscopy is presented. This cov...
Electron energy-loss spectroscopy (EELS) is an analytical microscopy technique which measures the en...
An overview of recent progress in high loss electron energy loss spectroscopy is presented. This cov...
A method for spectral acquisition, called binned gain averaging, will be described and tested. Syste...
Electron energy-loss spectroscopy (EELS) is a technique that can give useful information on elementa...
Electron energy-loss spectroscopy (EELS) is a technique that can give useful information on elementa...
Electron energy-loss spectroscopy (EELS) is a technique that can give useful information on elementa...
This is an AAM - Author Accepted Manuscript of the article published by Elsevier B.V. in Ultramicros...
This thesis describes the results of an investigation into the design of a parallel recording system...
The detection and quantification of low energy, low level edges presents several problems for Electr...