Abstract. Standard tools for CAD have limited modes of the sensitivity analysis: PSPICE only contains a static mode and SPECTRE includes frequency-domain and static modes. However, many RF systems use symmetrical structures for enhancing the circuit properties. For such systems, the static sensitivities are zero on principle and hence the time-domain sensitivity analysis should be used. In the paper, a novel re-current formula for the time-domain sensitivity analysis is derived which uses by-products of an efficient implicit in-tegration algorithm. As the selected integration algorithm is more flexible than the Gear’s one that is ordinarily used, the sensitivity analysis is more efficient in comparison with the standard CAD tools. An implem...
Abstract:- The paper proposes a procedure to calculate the sensitivity factors of the quiescent drai...
An accurate, yet computationally efficient, Computer Aided Design (CAD) framework is proposed for th...
We present a general approach to concurrently describe small-change variations of a semiconductor de...
Standard tools for CAD have limited modes of the sensitivity analysis: PSPICE only contains a static...
Abstract--In this paper, a unified theory for frequency-domain simula-tion and sensitivity analysis ...
Electric simulation allows one to replace real-circuit measurements by computer-aided circuit simula...
The present thrust in the electronics industry towards integrating multiple functions on a single ch...
Sensitivity analysis belongs to the most important tools in optimization theory. It determines the d...
A sensitivity analysis method for the equivalent parameter extraction of transient magnetic field pr...
This paper describes a simple method to compute the impulse sensitivity function of oscillators by m...
International audienceThe paper presents an improvement of sensitivity and tolerance analysis method...
Abstract The paper presents three procedures for the sensitivity analysis using auxiliary circuits:...
The paper presents an efficient technique for evaluating the DC sensitivity of GaAs monopolar or bip...
Conventional sensitivity analysis based on model-order reduction techniques guarantee the passivity ...
There is a revival of the interest in adjoint sensitivity analysis techniques. This is partly becaus...
Abstract:- The paper proposes a procedure to calculate the sensitivity factors of the quiescent drai...
An accurate, yet computationally efficient, Computer Aided Design (CAD) framework is proposed for th...
We present a general approach to concurrently describe small-change variations of a semiconductor de...
Standard tools for CAD have limited modes of the sensitivity analysis: PSPICE only contains a static...
Abstract--In this paper, a unified theory for frequency-domain simula-tion and sensitivity analysis ...
Electric simulation allows one to replace real-circuit measurements by computer-aided circuit simula...
The present thrust in the electronics industry towards integrating multiple functions on a single ch...
Sensitivity analysis belongs to the most important tools in optimization theory. It determines the d...
A sensitivity analysis method for the equivalent parameter extraction of transient magnetic field pr...
This paper describes a simple method to compute the impulse sensitivity function of oscillators by m...
International audienceThe paper presents an improvement of sensitivity and tolerance analysis method...
Abstract The paper presents three procedures for the sensitivity analysis using auxiliary circuits:...
The paper presents an efficient technique for evaluating the DC sensitivity of GaAs monopolar or bip...
Conventional sensitivity analysis based on model-order reduction techniques guarantee the passivity ...
There is a revival of the interest in adjoint sensitivity analysis techniques. This is partly becaus...
Abstract:- The paper proposes a procedure to calculate the sensitivity factors of the quiescent drai...
An accurate, yet computationally efficient, Computer Aided Design (CAD) framework is proposed for th...
We present a general approach to concurrently describe small-change variations of a semiconductor de...