A s discussed by Lorimer (this volume), the several advantages of analytical electron microscopy over conventional e ectron probe microanalysis are par-ticularly appropriate to the study of clay minerals. First of these is greatly improved spatial resolution which is partly the result of very small excitation volumes in the ultra-thin rock sections normally used. It is thus possible to obtain analytical data from single crystals of micrometre dimensions--a necessity for most clay mineral research. In many cases this level of resolution is required simply to avoid contamination by oxides and hydroxides as well as by other clay minerals. This analytical advantage should also be seen i
The principle of transmission electron microscopy is summarized. Preparation methods specially used ...
The chemical composition of reference clays has been studied by quantitative X-Ray Energy Dispersive...
Characterization of reference clay mineral standards was accomplished by use of the scanning electro...
Analytical transmission electron microscopy (TEM) is used to reveal sub-micrometer, internal fine st...
Previously published transmission electron microscopic (TEM) studies of clay minerals from sandstone...
Master of ScienceGeologyUniversity of Michiganhttp://deepblue.lib.umich.edu/bitstream/2027.42/114704...
A B S T R ACT: The use of electron microscopy to study clay microfabrics in thin-sections i discusse...
Studies of clay minerals in thin-section are often hampered by their fine grain size and because sev...
International audienceThe composition of the phyllosilicates mica and chlorite is commonly used in t...
Abstract--Diffusion of alkali and low-atomic-number elements during the microbeam analysis of some s...
The mutual disposition of mineral particles and voids in the micron and sub-micron size ranges is ge...
A 200 kV analytical electron microscope (Hitachi-700H) has been used for quantitative chemical analy...
Improvements in replica techniques have made possible the high magnification study of textural chara...
Scanning electron microscopy/energy dispersive spectroscopy (SEM/EDS) analysis of smear slides of or...
Accurate thin-film energy dispersive spectroscopic (EDS) analyses of clays with low-atomic-number (l...
The principle of transmission electron microscopy is summarized. Preparation methods specially used ...
The chemical composition of reference clays has been studied by quantitative X-Ray Energy Dispersive...
Characterization of reference clay mineral standards was accomplished by use of the scanning electro...
Analytical transmission electron microscopy (TEM) is used to reveal sub-micrometer, internal fine st...
Previously published transmission electron microscopic (TEM) studies of clay minerals from sandstone...
Master of ScienceGeologyUniversity of Michiganhttp://deepblue.lib.umich.edu/bitstream/2027.42/114704...
A B S T R ACT: The use of electron microscopy to study clay microfabrics in thin-sections i discusse...
Studies of clay minerals in thin-section are often hampered by their fine grain size and because sev...
International audienceThe composition of the phyllosilicates mica and chlorite is commonly used in t...
Abstract--Diffusion of alkali and low-atomic-number elements during the microbeam analysis of some s...
The mutual disposition of mineral particles and voids in the micron and sub-micron size ranges is ge...
A 200 kV analytical electron microscope (Hitachi-700H) has been used for quantitative chemical analy...
Improvements in replica techniques have made possible the high magnification study of textural chara...
Scanning electron microscopy/energy dispersive spectroscopy (SEM/EDS) analysis of smear slides of or...
Accurate thin-film energy dispersive spectroscopic (EDS) analyses of clays with low-atomic-number (l...
The principle of transmission electron microscopy is summarized. Preparation methods specially used ...
The chemical composition of reference clays has been studied by quantitative X-Ray Energy Dispersive...
Characterization of reference clay mineral standards was accomplished by use of the scanning electro...