In tapping-mode atomic force microscopy, nonlinear e¤ects due to large variations in the force …eld on the probe tip over very small length scales and the intermittency of contact may induce strong dynamical instabilities. In this paper, a discontinuity-mapping-based analysis is employed to investigate the destabilizing e¤ects of low-velocity contact on a lumped-mass model of an oscillating atomic-force-microscope cantilever tip interacting with a typical sample surface. As illustrated using two tip-sample force models, the analysis qualitatively captures the potential loss of stability and disappearance of a low-contact-velocity steady-state response. The quantitative agreement of the predictions of the discontinuity-mapping-based analysis...
AbstractThe Atomic Force Microscope (AFM) scans the topography of a sample surface using a micro-siz...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
In tapping-mode atomic-force microscopy, non-linear effects due to large variations in the force fie...
In tapping-mode atomic-force microscopy, non-linear effects due to large variations in the force fie...
Tapping-mode atomic force microscopy has wide applica-tions for probing the nanoscale surface and su...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2009.The case of co-dimension two ...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2009.The case of co-dimension two ...
This paper considers discontinuity-induced bifurcations due to the onset and termination of hysteret...
AbstractThe Atomic Force Microscope (AFM) scans the topography of a sample surface using a micro-siz...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
In tapping-mode atomic-force microscopy, non-linear effects due to large variations in the force fie...
In tapping-mode atomic-force microscopy, non-linear effects due to large variations in the force fie...
Tapping-mode atomic force microscopy has wide applica-tions for probing the nanoscale surface and su...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-su...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2009.The case of co-dimension two ...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2009.The case of co-dimension two ...
This paper considers discontinuity-induced bifurcations due to the onset and termination of hysteret...
AbstractThe Atomic Force Microscope (AFM) scans the topography of a sample surface using a micro-siz...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...