Abstract – Boundary-scan, formally known as IEEE 1149.1-2001, is a collection of design rules applied at Integrated Circuit (IC) level that allows standardized approaches of testing the IC internally and at board level. The current approach for designing an integrated circuit as SoC (System-on-Chip) is based on the reusing the model for a very well defined block. This paper presents an reusable IP core that has two standard interfaces: JTAG interface for testing and standardized access purpose and OCP interface that facilitates "plug and play " SoC design. This design has been checked in synthesis and proved by several ASIC implementations
This paper discusses the reuse and retargeting of test instruments and test patterns using the IEEE ...
Abstract. As System on a Chip (SoC) testing faces new challenges, some new test architectures must b...
Abstract-As the design of SoC is getting more and more complicated, the IPs (Intellectual Property) ...
This paper describes a novel optimized JTAG interface circuit between a JTAG controller and target I...
With the increasing complexity of modern System-on-Chip (SoC) designs, more and more intellectual pr...
International audienceMany modern devices have a very limited number of digital pins, yet they are o...
As the technology is shrinking and the working frequency is going into multi gigahertz range, the is...
The standard IEEE 1149.1 (Test Access Port and Boundary-Scan Architecture, also known as JTAG port) ...
This document briefly describes the upcoming standard IEEE 1500 [1], titled "Standard Testabili...
A standardized and structured test methodology is described which is based on the boundary-scan prop...
Standard access methods for Design for Testsbility (DfT) rely on the IEEE 1149.1 (JTAG) Test Access ...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
Boundary-Scan Architecture (JTAG) is widely used as a debug interface, providing a path for a debugg...
A new core test wrapper design approach is proposed which transports streaming test data, for exampl...
Abstract—Intellectual property (IP) blocks are connected in a system on chip using a bus or network-...
This paper discusses the reuse and retargeting of test instruments and test patterns using the IEEE ...
Abstract. As System on a Chip (SoC) testing faces new challenges, some new test architectures must b...
Abstract-As the design of SoC is getting more and more complicated, the IPs (Intellectual Property) ...
This paper describes a novel optimized JTAG interface circuit between a JTAG controller and target I...
With the increasing complexity of modern System-on-Chip (SoC) designs, more and more intellectual pr...
International audienceMany modern devices have a very limited number of digital pins, yet they are o...
As the technology is shrinking and the working frequency is going into multi gigahertz range, the is...
The standard IEEE 1149.1 (Test Access Port and Boundary-Scan Architecture, also known as JTAG port) ...
This document briefly describes the upcoming standard IEEE 1500 [1], titled "Standard Testabili...
A standardized and structured test methodology is described which is based on the boundary-scan prop...
Standard access methods for Design for Testsbility (DfT) rely on the IEEE 1149.1 (JTAG) Test Access ...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
Boundary-Scan Architecture (JTAG) is widely used as a debug interface, providing a path for a debugg...
A new core test wrapper design approach is proposed which transports streaming test data, for exampl...
Abstract—Intellectual property (IP) blocks are connected in a system on chip using a bus or network-...
This paper discusses the reuse and retargeting of test instruments and test patterns using the IEEE ...
Abstract. As System on a Chip (SoC) testing faces new challenges, some new test architectures must b...
Abstract-As the design of SoC is getting more and more complicated, the IPs (Intellectual Property) ...