Add to ORKGAbstract – In this paper a modified architecture for at-speed scan testing is presented. This new architecture addresses the trend in the semiconductor industry for increased at-speed structural testing. The proposed architecture offers reduced time for standard at-speed testing, and, in particular, substantial savings for the repeated at-speed testing required for microprocessor speed and performance binning. The architecture has been demonstrated on UMC 0.18µm and has achieved with little die overhead
Abstract— With the remarkable scaling down of technology, test engineers are encountered with new ch...
Abstract—We propose a procedure for generating compact test sets with enhanced at-speed testing capa...
We propose a new design for testability technique, Parallel Serial Full Scan (PSFS), for reducing th...
In this paper a modified architecture for at-speed scan testing is presented. This new architecture ...
This paper discusses the aspects and associated requirements of design and implementation of at-spee...
Abstract- In this paper we will present an on-chip method for testing high performance memory device...
A test architecture for an SOC consists of a number of Test Access Mechanisms that connect to wrappe...
In this paper we will present an on-chip method for testing high performance memory devices, that oc...
Abstract — Process variations make at-speed testing sig-nificantly more difficult. They cause subtle...
Abstract. We have introduced a low-cost at-speed BIST architecture that enables conventional micropr...
With today’s design size in millions of gates and working frequency in gigahertz range, at-speed tes...
As technology down scaling continues, new technical challenges emerge for the Integrated Circuits (I...
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at ...
Today's System-on-a-Chip (SoC) is designed with reusable IP cores to meet short time-to-market requi...
The size of the test vector set forms a significant factor in the overall production costs of ICs, a...
Abstract— With the remarkable scaling down of technology, test engineers are encountered with new ch...
Abstract—We propose a procedure for generating compact test sets with enhanced at-speed testing capa...
We propose a new design for testability technique, Parallel Serial Full Scan (PSFS), for reducing th...
In this paper a modified architecture for at-speed scan testing is presented. This new architecture ...
This paper discusses the aspects and associated requirements of design and implementation of at-spee...
Abstract- In this paper we will present an on-chip method for testing high performance memory device...
A test architecture for an SOC consists of a number of Test Access Mechanisms that connect to wrappe...
In this paper we will present an on-chip method for testing high performance memory devices, that oc...
Abstract — Process variations make at-speed testing sig-nificantly more difficult. They cause subtle...
Abstract. We have introduced a low-cost at-speed BIST architecture that enables conventional micropr...
With today’s design size in millions of gates and working frequency in gigahertz range, at-speed tes...
As technology down scaling continues, new technical challenges emerge for the Integrated Circuits (I...
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at ...
Today's System-on-a-Chip (SoC) is designed with reusable IP cores to meet short time-to-market requi...
The size of the test vector set forms a significant factor in the overall production costs of ICs, a...
Abstract— With the remarkable scaling down of technology, test engineers are encountered with new ch...
Abstract—We propose a procedure for generating compact test sets with enhanced at-speed testing capa...
We propose a new design for testability technique, Parallel Serial Full Scan (PSFS), for reducing th...