Abstract- Chip temperature in power MOSFETs is commonly obtained (e.g. for thermal characterisation purposes) by feeding a known, controlled low DC-current in the body diode and measuring the forward-voltage drop. Drain current might be estimated by a voltage measurement across drain and source terminals, on-state resistance acting as a shunt, assuming that the temperature is known and constant. Such voltage-based measurements are attractive, but dependencies limit their application to laboratory environment. In industrial converters, neither temperature nor current are known a priori. Here we show that by combining the two techniques, previous limitations are overcome. Temperature and current come as two separate polynomial expressions. Th...
A new method for junction temperature measurement of power semiconductor switches is presented. The ...
The temperature of a power semiconductor device is important for both its optimal operation and reli...
Abstract When the MOS tunneling diode with ultra-thin oxide was positively biased , the gate ...
Abstract – This paper describes a method to extract internal temperature and drain current values of...
Junction temperature estimation for power electronics devices is gaining more importance every day. ...
This paper examines a number of techniques for junction temperature estimation of SiC MOSFETs devi...
This paper presents a current sensing principle appropriate for use in power electronics’ converters...
This paper presents a current sensing principle appropriate for use in power electronics’ converters...
A new method for junction temperature measurement of MOS-gated power semiconductor switches is prese...
The experimental characterization of the thermal impedance Zth of large power MOSFETs is commonly do...
Thermal management circuits have been used for many years in systems such as air conditioners, ovens...
This paper deals with real-time estimation of the junction temperature of SiC power MOSFETs. The jun...
Three electrical techniques (pulsed-gate, ACconductance and sense-diode) for temperature evaluation ...
This paper analyzes the feasibility of using metal-oxide-semiconductor field-effect transistors (MOS...
This paper presents a method of thermal balancing for monolithic power integrated circuits (ICs). An...
A new method for junction temperature measurement of power semiconductor switches is presented. The ...
The temperature of a power semiconductor device is important for both its optimal operation and reli...
Abstract When the MOS tunneling diode with ultra-thin oxide was positively biased , the gate ...
Abstract – This paper describes a method to extract internal temperature and drain current values of...
Junction temperature estimation for power electronics devices is gaining more importance every day. ...
This paper examines a number of techniques for junction temperature estimation of SiC MOSFETs devi...
This paper presents a current sensing principle appropriate for use in power electronics’ converters...
This paper presents a current sensing principle appropriate for use in power electronics’ converters...
A new method for junction temperature measurement of MOS-gated power semiconductor switches is prese...
The experimental characterization of the thermal impedance Zth of large power MOSFETs is commonly do...
Thermal management circuits have been used for many years in systems such as air conditioners, ovens...
This paper deals with real-time estimation of the junction temperature of SiC power MOSFETs. The jun...
Three electrical techniques (pulsed-gate, ACconductance and sense-diode) for temperature evaluation ...
This paper analyzes the feasibility of using metal-oxide-semiconductor field-effect transistors (MOS...
This paper presents a method of thermal balancing for monolithic power integrated circuits (ICs). An...
A new method for junction temperature measurement of power semiconductor switches is presented. The ...
The temperature of a power semiconductor device is important for both its optimal operation and reli...
Abstract When the MOS tunneling diode with ultra-thin oxide was positively biased , the gate ...