Graduation date: 1992The low thermal conductivity of gallium arsenide compared to silicon\ud results in self-heating effects in GaAs MESFETs that limit the electrical\ud performance of such devices for high power applications. To date, analytical\ud thermal models of self heating in GaAs MESFETs are based on the assumption\ud of a uniformly heated channel. This thesis presents a two dimensional analysis\ud of the electrothermal effect of this device based on the two dimensional\ud power density distribution in the channel under various bias conditions. The\ud numerical simulation is performed using the finite difference technique. The\ud results of the simulation of an isothermal MESFET without heat effects is\ud compared with various one d...
Recent trend of minimization in microprocessors has introduced increasing self-heating effects in Fi...
We propose a new experimental technique of measuring the effective electron temperature in the chann...
This paper discusses self-heating (SHE) effects in silicon-on-insulator (SOI) CMOS technology and ap...
The low thermal conductivity of gallium arsenide compared to silicon results in selfheating effects ...
A new physical-based electrothermal model for GaAs MESFET is presented. The 2-D electrical model bas...
This paper deals with using device-level numerical simulations for the investigation of the electro-...
MESFET are used in circuits of gigahertz frequencies as they are based on gallium arsenide (GaAs) ha...
Operating channel temperature has an important influence on the electrical performance and reliabili...
We propose a new model for GaAs MESFFETs that we incorporated into a circuit simulator. The improvem...
In this paper it is proposed an automatic procedure to extract optimal layout parameters in order to...
[[abstract]]Investigates the effects of self-heating on the high current I -V characteristics of sem...
An analytical model is developed to estimate the effect of the scaling of the buried oxide on the he...
An electrothermal characterization of GaAs MESFET has been performed using pulsed measurements. The ...
The lower thermal conductivity of gallium arsenide (GaAs) compared to silicon (Si) requires a carefu...
GaAs pHEMT thermal reliability test structures are introduced which incorporate on-wafer heating usi...
Recent trend of minimization in microprocessors has introduced increasing self-heating effects in Fi...
We propose a new experimental technique of measuring the effective electron temperature in the chann...
This paper discusses self-heating (SHE) effects in silicon-on-insulator (SOI) CMOS technology and ap...
The low thermal conductivity of gallium arsenide compared to silicon results in selfheating effects ...
A new physical-based electrothermal model for GaAs MESFET is presented. The 2-D electrical model bas...
This paper deals with using device-level numerical simulations for the investigation of the electro-...
MESFET are used in circuits of gigahertz frequencies as they are based on gallium arsenide (GaAs) ha...
Operating channel temperature has an important influence on the electrical performance and reliabili...
We propose a new model for GaAs MESFFETs that we incorporated into a circuit simulator. The improvem...
In this paper it is proposed an automatic procedure to extract optimal layout parameters in order to...
[[abstract]]Investigates the effects of self-heating on the high current I -V characteristics of sem...
An analytical model is developed to estimate the effect of the scaling of the buried oxide on the he...
An electrothermal characterization of GaAs MESFET has been performed using pulsed measurements. The ...
The lower thermal conductivity of gallium arsenide (GaAs) compared to silicon (Si) requires a carefu...
GaAs pHEMT thermal reliability test structures are introduced which incorporate on-wafer heating usi...
Recent trend of minimization in microprocessors has introduced increasing self-heating effects in Fi...
We propose a new experimental technique of measuring the effective electron temperature in the chann...
This paper discusses self-heating (SHE) effects in silicon-on-insulator (SOI) CMOS technology and ap...