Add to ORKGAbstract: New types of weak forces measurements with Atomic Force Microscope (AFM) are very challenging for experimental physics and call for new studies on control strategies operating the AFM. It is thus necessary to ¯rst develop a precise model of the cantilever with its sharp tip, in interaction with the scanned sample. This paper presents a model of the cantilever, that is based on beam theory and taking into account the in°uence of the long distance interaction forces. Copyright c°2005 IFA
The dynamic behavior of rectangular, dagger-shaped, V-shaped and triangular cantilevers in atomic fo...
In most commercial atomic force microscopes, dynamic modes are now available as standard operation m...
Due to the harmonic motion of the cantilever in Tapping Mode Atomic Force Microscopy, it is seemingl...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
An atomic force microscope can acquire both topographic and materials-related data, but with cantile...
[[abstract]]Atomic force microscopy (AFM) probe with different functions can be used to measure the ...
Atomic force microscopy (AFM) employs microfabricated cantilevers as sensing elements, which are use...
The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of i...
In atomic force microscopy (AFM) a sharp tip fixed close to the free end of a cantilever beam intera...
This paper is concerned with the flexural vibration of an atomic force microscope (AFM) cantilever. ...
In this study, an analytical method for the static deflection of an AFM nonuniform probe subjected t...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
This paper is concerned with the flexural vibration of an atomic force microscope (AFM) cantilever. ...
Nanomanipulation shows its powerful potential with its broad applications, and using AFM as a simple...
It is crucial to calibrate atomic force microscope (AFM) cantilevers for the development and further...
The dynamic behavior of rectangular, dagger-shaped, V-shaped and triangular cantilevers in atomic fo...
In most commercial atomic force microscopes, dynamic modes are now available as standard operation m...
Due to the harmonic motion of the cantilever in Tapping Mode Atomic Force Microscopy, it is seemingl...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
An atomic force microscope can acquire both topographic and materials-related data, but with cantile...
[[abstract]]Atomic force microscopy (AFM) probe with different functions can be used to measure the ...
Atomic force microscopy (AFM) employs microfabricated cantilevers as sensing elements, which are use...
The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of i...
In atomic force microscopy (AFM) a sharp tip fixed close to the free end of a cantilever beam intera...
This paper is concerned with the flexural vibration of an atomic force microscope (AFM) cantilever. ...
In this study, an analytical method for the static deflection of an AFM nonuniform probe subjected t...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
This paper is concerned with the flexural vibration of an atomic force microscope (AFM) cantilever. ...
Nanomanipulation shows its powerful potential with its broad applications, and using AFM as a simple...
It is crucial to calibrate atomic force microscope (AFM) cantilevers for the development and further...
The dynamic behavior of rectangular, dagger-shaped, V-shaped and triangular cantilevers in atomic fo...
In most commercial atomic force microscopes, dynamic modes are now available as standard operation m...
Due to the harmonic motion of the cantilever in Tapping Mode Atomic Force Microscopy, it is seemingl...