Add to ORKGIn this paper we propose a new Built in Current Sensor (BICS) to detect single event upsets in SRAM. The BICS is designed and validated for 100nm process technology. The BICS reliability analysis for process, voltage, tempera-ture, and power supply noise are provided. This BICS detect various shapes of current pulses generated due to particle strike. The BICS power consumption and area overhead are also provided. This BICS found to be very reliable for pro-cess, voltage and temperature variation and under stringent noise conditions. 1
Due to advance technologies transistor size shrinks which makes the devices more vulnerable to noise...
International audienceSoft error resilience is an increasingly important requirement of integrated c...
CMOS is a popular technology today for very large scale integrated (VLSI) circuits. But, conventiona...
In this paper we propose a new Built in Current Sensor (BICS) to detect single event upsets in SRAM....
ISBN: 0769522882We propose a new built-in current sensor (BICS) to detect single event upsets (SEUs)...
ISBN: 0818655208We present a new technique to improve the reliability of SRAMs used in space radiati...
NUMBER OF PAGES: xii+1011This paper presents implementation and test experiments of a current monito...
This paper presents an analysis of the reliability of memories protected with Built-in Current Senso...
This paper presents the challenges and solutions of applying Built-In-Current Sensors (BICS) to a sa...
A technique for concurrently checking faults in static CMOS circuits is proposed. It performs concur...
This paper presents a study of the behavior of a built-in current sensor (BICS) to be used for onlin...
Memories are one of the most widely used elements in electronic systems, and their reliability when ...
International audienceThis work presents a novel scheme of built-in current sensor (BICS) for detect...
ISBN: 0769524060In this paper, the authors introduced an approach for single-word multiple-bit upset...
This paper presents a parameterized current sensor able to detect transient ionization in the silico...
Due to advance technologies transistor size shrinks which makes the devices more vulnerable to noise...
International audienceSoft error resilience is an increasingly important requirement of integrated c...
CMOS is a popular technology today for very large scale integrated (VLSI) circuits. But, conventiona...
In this paper we propose a new Built in Current Sensor (BICS) to detect single event upsets in SRAM....
ISBN: 0769522882We propose a new built-in current sensor (BICS) to detect single event upsets (SEUs)...
ISBN: 0818655208We present a new technique to improve the reliability of SRAMs used in space radiati...
NUMBER OF PAGES: xii+1011This paper presents implementation and test experiments of a current monito...
This paper presents an analysis of the reliability of memories protected with Built-in Current Senso...
This paper presents the challenges and solutions of applying Built-In-Current Sensors (BICS) to a sa...
A technique for concurrently checking faults in static CMOS circuits is proposed. It performs concur...
This paper presents a study of the behavior of a built-in current sensor (BICS) to be used for onlin...
Memories are one of the most widely used elements in electronic systems, and their reliability when ...
International audienceThis work presents a novel scheme of built-in current sensor (BICS) for detect...
ISBN: 0769524060In this paper, the authors introduced an approach for single-word multiple-bit upset...
This paper presents a parameterized current sensor able to detect transient ionization in the silico...
Due to advance technologies transistor size shrinks which makes the devices more vulnerable to noise...
International audienceSoft error resilience is an increasingly important requirement of integrated c...
CMOS is a popular technology today for very large scale integrated (VLSI) circuits. But, conventiona...