Add to ORKGAbstract- In this paper we will present an on-chip method for testing high performance memory devices, that occupies minimal area and retains full flexibility. This is achieved through microcode test instructions and the associated on-chip state machine. In addition, the proposed methodology will enable at-speed testing of memory devices. The relevancy of this work is placed in context with an introduction to memory testing and the techniques and algorithms generally used today
This paper presents a versatile and portable test equipment, called portable ATE for research and de...
The development of the sub-micron technology makes it possible that the manufacturer of ASIC integra...
Up to 53% of the time spent on testing current Intel microprocessors is needed to test on-chip cache...
In this paper we will present an on-chip method for testing high performance memory devices, that oc...
System on Chip devices include an increasing number of embedded memory cores, whose test durin...
Abstract – In this paper a modified architecture for at-speed scan testing is presented. This new ar...
Abstract. We have introduced a low-cost at-speed BIST architecture that enables conventional micropr...
Today's computing architectures and device technologies are incapable of meeting the increasingly st...
Embedded memory is the most common circuitry in all System on Chip (SoC). It is also a critical circ...
The design and architecture of a reconfigurable memory BIST unit is presented. The proposed memory B...
Method for testing a memory under test (1) comprising a plurality of memory cells and a Memory Built...
Abstract—As there are increasing functionalities in modern system-on-chip (SOC) design, the amount o...
We propose a new on-line testing approach for the control logic of high performance microprocessors....
Newer defects in memories arising from shrinking manufacturing technologies demand improved memory t...
In this paper a modified architecture for at-speed scan testing is presented. This new architecture ...
This paper presents a versatile and portable test equipment, called portable ATE for research and de...
The development of the sub-micron technology makes it possible that the manufacturer of ASIC integra...
Up to 53% of the time spent on testing current Intel microprocessors is needed to test on-chip cache...
In this paper we will present an on-chip method for testing high performance memory devices, that oc...
System on Chip devices include an increasing number of embedded memory cores, whose test durin...
Abstract – In this paper a modified architecture for at-speed scan testing is presented. This new ar...
Abstract. We have introduced a low-cost at-speed BIST architecture that enables conventional micropr...
Today's computing architectures and device technologies are incapable of meeting the increasingly st...
Embedded memory is the most common circuitry in all System on Chip (SoC). It is also a critical circ...
The design and architecture of a reconfigurable memory BIST unit is presented. The proposed memory B...
Method for testing a memory under test (1) comprising a plurality of memory cells and a Memory Built...
Abstract—As there are increasing functionalities in modern system-on-chip (SOC) design, the amount o...
We propose a new on-line testing approach for the control logic of high performance microprocessors....
Newer defects in memories arising from shrinking manufacturing technologies demand improved memory t...
In this paper a modified architecture for at-speed scan testing is presented. This new architecture ...
This paper presents a versatile and portable test equipment, called portable ATE for research and de...
The development of the sub-micron technology makes it possible that the manufacturer of ASIC integra...
Up to 53% of the time spent on testing current Intel microprocessors is needed to test on-chip cache...