Abstract: With the motivation of developing more realistic test plans, an attempt is made in this paper to construct reliability test plans for the components of series systems under the assumptions that • the component lifetimes are independent, identically distributed exponential random variables, • the failure rates of these exponential random variables depend on covariates, such as room temperature, humidity etc. through linear and exponential relationships. Our test plans differ from the test plans proposed by Altinel and Özekici (1997) and Alitnel et al. (2001, 2002) in the sense that the former assume dependence on covariates through explicit relationships, while the latter make a very general assumption concerning dependence on cov...
Proceedings of the ASME International Engineering Congress and RDandD Exposition, Washington, DC, No...
Time-dependent system reliability is measured by the probability that the responses of a system do n...
Accelerated life testing (ALT) has been widely used to expedite the analysis of a product's failure ...
Abstract: Most of the component level reliability test plans that are available in literature have b...
This paper proposes a reliability test plan for a series system, by considering the parameter lambda...
In order to draw cost-effective inferences on the reliability of a system one approach is to design ...
In this research, a difficult yet practical problem of modeling failures as functions of stress prof...
Most systems are composed of several subsystems. The reliability of a system depends on how the comp...
This study aims to investigate the reliability properties of the systems constituted of three identi...
This paper considers the design of a minimum cost, system based, component test plan for evaluating ...
AbstractThis paper deals with the reliability function and the failure rate of the k out of n system...
Modern Engineering Asset Management (EAM) requires the accurate assessment of current and the predic...
One of important classical reliability problems can be formulated as follows. Given a k-component sy...
In this research two problems related to system reliability are addressed: the first is commonly ref...
[[abstract]]This paper introduces a general or “distribution-free” model to analyze the lifetime of ...
Proceedings of the ASME International Engineering Congress and RDandD Exposition, Washington, DC, No...
Time-dependent system reliability is measured by the probability that the responses of a system do n...
Accelerated life testing (ALT) has been widely used to expedite the analysis of a product's failure ...
Abstract: Most of the component level reliability test plans that are available in literature have b...
This paper proposes a reliability test plan for a series system, by considering the parameter lambda...
In order to draw cost-effective inferences on the reliability of a system one approach is to design ...
In this research, a difficult yet practical problem of modeling failures as functions of stress prof...
Most systems are composed of several subsystems. The reliability of a system depends on how the comp...
This study aims to investigate the reliability properties of the systems constituted of three identi...
This paper considers the design of a minimum cost, system based, component test plan for evaluating ...
AbstractThis paper deals with the reliability function and the failure rate of the k out of n system...
Modern Engineering Asset Management (EAM) requires the accurate assessment of current and the predic...
One of important classical reliability problems can be formulated as follows. Given a k-component sy...
In this research two problems related to system reliability are addressed: the first is commonly ref...
[[abstract]]This paper introduces a general or “distribution-free” model to analyze the lifetime of ...
Proceedings of the ASME International Engineering Congress and RDandD Exposition, Washington, DC, No...
Time-dependent system reliability is measured by the probability that the responses of a system do n...
Accelerated life testing (ALT) has been widely used to expedite the analysis of a product's failure ...