Add to ORKGIn this paper, a new approach for reducing the subthreshold leakage current of digital circuits is proposed. It does not use a multi-threshold process technique which is more expensive. The technique which makes to use of a new variable supply voltage oscillator, combines the ideas of both Standby Leakage Control Using Transistor Stacks (SRB) and variable threshold (VT) methods. In this technique compared to the Leakage Control Using Transistor Stacks method, the subthreshold current decreases three times. In addition, leakage current monitor (LCM) and its related circuits which are used in VT techniques are not required here. This makes the proposed technique more power and area efficient. Categories and Subject Descriptors: B.7.1 [Hardwar...
Abstract — Leakage power dissipation has become a sizable proportion of the total power dissipation ...
We show that a technique previously introduced for subthreshold leakage reduction can be effectively...
We show that a technique previously introduced for subthreshold leakage reduction can be effectively...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer...
There is an increasing demand for portable devices powered up by battery, this led the manufacturers...
In this paper, four new hybrid digital circuit design techniques, namely, hybrid multi-threshold CMO...
Most of the portable systems, such as cellular communication devices, and laptop computers operate f...
Power dissipation is a key consideration in the design of nano-scale CMOS VLSI circuits. Various tec...
Graduation date: 2005Recent trends in CMOS technology and scaling of devices clearly indicate that l...
Abstract – In Integrated Circuits (IC), the transistor density is increased by scaling down the size...
In order to reduce the power dissipation of CMOS products, semiconductor manufacturers are reducing ...
CMOS technology has scaled aggressively over the past few decades in an effort to enhance functional...
In order to reduce the power dissipation of CMOS products, semiconductor manufacturers are reducing ...
AbstractThe leakage power dissipation has become one of the most challenging issues in low power VLS...
Power dissipation due to leakage current in the digital circuits is a biggest factor which is consid...
Abstract — Leakage power dissipation has become a sizable proportion of the total power dissipation ...
We show that a technique previously introduced for subthreshold leakage reduction can be effectively...
We show that a technique previously introduced for subthreshold leakage reduction can be effectively...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer...
There is an increasing demand for portable devices powered up by battery, this led the manufacturers...
In this paper, four new hybrid digital circuit design techniques, namely, hybrid multi-threshold CMO...
Most of the portable systems, such as cellular communication devices, and laptop computers operate f...
Power dissipation is a key consideration in the design of nano-scale CMOS VLSI circuits. Various tec...
Graduation date: 2005Recent trends in CMOS technology and scaling of devices clearly indicate that l...
Abstract – In Integrated Circuits (IC), the transistor density is increased by scaling down the size...
In order to reduce the power dissipation of CMOS products, semiconductor manufacturers are reducing ...
CMOS technology has scaled aggressively over the past few decades in an effort to enhance functional...
In order to reduce the power dissipation of CMOS products, semiconductor manufacturers are reducing ...
AbstractThe leakage power dissipation has become one of the most challenging issues in low power VLS...
Power dissipation due to leakage current in the digital circuits is a biggest factor which is consid...
Abstract — Leakage power dissipation has become a sizable proportion of the total power dissipation ...
We show that a technique previously introduced for subthreshold leakage reduction can be effectively...
We show that a technique previously introduced for subthreshold leakage reduction can be effectively...