Power dissipation is quickly becoming one of the most important limiters in nanometer IC design for leakage increases exponentially as the technology scaling down. However, power and timing are often conflicting objectives during optimization. In this paper, we propose a novel total power optimization flow under performance constraint. Instead of using placement, gate sizing, and multiple-Vt assignment techniques independently, we combine them together through the concept of slack distribution management to maximize the potential for power reduction. We propose to use the linear pro-gramming (LP) based placement and the geometric programming (GP) based gate sizing formulations to improve the slack distribu-tion, which helps to maximize the ...
Gate sizing in VLSI design is a widely-used method for power or area recovery subject to timing cons...
\u3cp\u3eFor many years, discrete gate sizing has been widely used for timing and power optimization...
Leakage power has become a serious concern in nanometer CMOS technologies, and power-gating has show...
Power-gating has proved to be one of the most effective solutions for reducing stand-by leakage powe...
textIn today's world, it is becoming increasingly important to be able to design high performance in...
Technology scaling has taken circuit performance to unprecedented levels in the deep submicron regim...
Sizing has shown its impact on design automation of VLSI circuits. At first, the cost of the circuit...
Process and device scaling in late-CMOS technologies highlight leakage power as a critical challenge...
Increasing levels of process variability in sub-100nm CMOS design has become a critical concern for ...
\u3cp\u3eLeakage power (active and standby) is becoming increasingly dominant part of total power co...
[[abstract]]This paper describes methods for reducing power consumption. We propose using gate sizin...
We describe an optimization strategy for minimizing total power consumption using dual threshold vol...
This paper presents a novel gate sizing methodology to mini-mize the leakage power in the presence o...
Technology scaling has been the driving force behind the growth of the semiconductor industry over t...
[[abstract]]Power consumption has gained much saliency in circuit design recently. One design proble...
Gate sizing in VLSI design is a widely-used method for power or area recovery subject to timing cons...
\u3cp\u3eFor many years, discrete gate sizing has been widely used for timing and power optimization...
Leakage power has become a serious concern in nanometer CMOS technologies, and power-gating has show...
Power-gating has proved to be one of the most effective solutions for reducing stand-by leakage powe...
textIn today's world, it is becoming increasingly important to be able to design high performance in...
Technology scaling has taken circuit performance to unprecedented levels in the deep submicron regim...
Sizing has shown its impact on design automation of VLSI circuits. At first, the cost of the circuit...
Process and device scaling in late-CMOS technologies highlight leakage power as a critical challenge...
Increasing levels of process variability in sub-100nm CMOS design has become a critical concern for ...
\u3cp\u3eLeakage power (active and standby) is becoming increasingly dominant part of total power co...
[[abstract]]This paper describes methods for reducing power consumption. We propose using gate sizin...
We describe an optimization strategy for minimizing total power consumption using dual threshold vol...
This paper presents a novel gate sizing methodology to mini-mize the leakage power in the presence o...
Technology scaling has been the driving force behind the growth of the semiconductor industry over t...
[[abstract]]Power consumption has gained much saliency in circuit design recently. One design proble...
Gate sizing in VLSI design is a widely-used method for power or area recovery subject to timing cons...
\u3cp\u3eFor many years, discrete gate sizing has been widely used for timing and power optimization...
Leakage power has become a serious concern in nanometer CMOS technologies, and power-gating has show...