in porous silicon

We have studied the dependence of porous silicon morphology on fabrication conditions and the link between morphology, porosity and surface resistance. Porosity of the samples and thickness were determined gravimetrically. Electron microscopy reveals the evolution of porous silicon layer morphology with variation in preparation conditions. Mean size of silicon nano particles decreases with increased silicon porosity as revealed in photoluminescence spectra, I-V characteristics and surface resistance. Results are consistent with the quantum confinement model of porous silicon luminescence