Add to ORKGWe propose a non-scan design-for-testability (DFT) method to increase the testability of synchronous sequential circuits. Non-scan DFT allows at-speed testing, as opposed to scan or partial-scan based DFT that normally leads to low-speed testing an
Autoscan, a design for testability (DFT) technique for synchronous sequential circuits. Scan operati...
This paper proposes a non-scan design-for-test-ability method for register-transfer level circuits w...
This dissertation is concerned with testing of asynchronous circuits. Asynchronous circuits are attr...
Introduction We propose a non-scan design-for-testability (DFT) method to increase the testability ...
As opposed to scan schemes, non-scan DFT allows at-speed testing. This paper suggests three techniqu...
This paper introduces a new design for testability methodology for sequential circuits based on inpu...
This paper introduces a new design for testability methodology for sequential circuits based on inpu...
This paper introduces a new design for testability methodology for sequential circuits based on inpu...
This paper introduces a new design for testability methodology for sequential circuits based on inpu...
This paper introduces a new design for testability methodology for sequential circuits based on inpu...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
Test cost comprises a substantial portion of producing an integrated circuit. As a result, structura...
Faulty chips will reach customer if IC testing is not performed on the fabricated IC. Simple types o...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
Autoscan, a design for testability (DFT) technique for synchronous sequential circuits. Scan operati...
This paper proposes a non-scan design-for-test-ability method for register-transfer level circuits w...
This dissertation is concerned with testing of asynchronous circuits. Asynchronous circuits are attr...
Introduction We propose a non-scan design-for-testability (DFT) method to increase the testability ...
As opposed to scan schemes, non-scan DFT allows at-speed testing. This paper suggests three techniqu...
This paper introduces a new design for testability methodology for sequential circuits based on inpu...
This paper introduces a new design for testability methodology for sequential circuits based on inpu...
This paper introduces a new design for testability methodology for sequential circuits based on inpu...
This paper introduces a new design for testability methodology for sequential circuits based on inpu...
This paper introduces a new design for testability methodology for sequential circuits based on inpu...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
Test cost comprises a substantial portion of producing an integrated circuit. As a result, structura...
Faulty chips will reach customer if IC testing is not performed on the fabricated IC. Simple types o...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
Autoscan, a design for testability (DFT) technique for synchronous sequential circuits. Scan operati...
This paper proposes a non-scan design-for-test-ability method for register-transfer level circuits w...
This dissertation is concerned with testing of asynchronous circuits. Asynchronous circuits are attr...