Simulation of semiconductor device is very difficult In 2 or 3 dimensional cases because of their Irregular boundaries involved. Usually finite element method is prelered in these cases. But, despite of the flexibility to adapt to any geometry, this method doesn't have a whole approval of the scientific community because Its programmation Is long and tedious, except It a well documented subroutine library Is available. Another method i. e. finite difference method is conceptually easier but requires a mapping from physical plane to rectangular coordinate plane. There are many procedures to generate this coordinate system. Among them, use of the Laplace equations, because of the simplicity of formulation and possibility of coordinate-li...
The two-dimensional isolation oxidation of silicon is considered for stress-dependent reaction and d...
Abstract — We present a sophisticated numerical model for the simulation of thermal oxidation on com...
Mathematical techniques for calculating the thickness of a grown oxide layer on Silicon nanowires (S...
Proceeding from a natural extension of the one-dimensional Deal and Grove relationship [2], a Bounda...
Our user oriented process simulation program called APT (Advenced Program for Tecnhology) has been i...
The oxidation process in metals governed by oxygen diffusion is modeled in this paper for 2-D domain...
An oxidation process is simulated for a bundle of metal tubes in a cross–flow. The fluid flow is gov...
A diffusion controlling oxidation model, considering scale removal, is developed in an oxygen-contai...
A two dimensional process simulator-MO.BI.DI.C- has been developed. The program can simulate ion imp...
The complexity of the future processing models and the need for three-dimensional simulation require...
Boundary conditions for viscous flow thermal oxidation equations in pressure potential form are deri...
Die thermische Oxidation ist Bestandteil zahlreicher Isolationsprozesse. Bei Strukturgrößen im Submi...
Consiglio Nazionale delle Ricerche - Biblioteca Centrale - P.le Aldo Moro, 7, Rome / CNR - Consiglio...
Internal oxidation is a process in which oxygen diffuses into an alloy and reacts with solute to for...
A two-dimensional general hydrodynamic equation (HDE) solver has been developed. The solver is capab...
The two-dimensional isolation oxidation of silicon is considered for stress-dependent reaction and d...
Abstract — We present a sophisticated numerical model for the simulation of thermal oxidation on com...
Mathematical techniques for calculating the thickness of a grown oxide layer on Silicon nanowires (S...
Proceeding from a natural extension of the one-dimensional Deal and Grove relationship [2], a Bounda...
Our user oriented process simulation program called APT (Advenced Program for Tecnhology) has been i...
The oxidation process in metals governed by oxygen diffusion is modeled in this paper for 2-D domain...
An oxidation process is simulated for a bundle of metal tubes in a cross–flow. The fluid flow is gov...
A diffusion controlling oxidation model, considering scale removal, is developed in an oxygen-contai...
A two dimensional process simulator-MO.BI.DI.C- has been developed. The program can simulate ion imp...
The complexity of the future processing models and the need for three-dimensional simulation require...
Boundary conditions for viscous flow thermal oxidation equations in pressure potential form are deri...
Die thermische Oxidation ist Bestandteil zahlreicher Isolationsprozesse. Bei Strukturgrößen im Submi...
Consiglio Nazionale delle Ricerche - Biblioteca Centrale - P.le Aldo Moro, 7, Rome / CNR - Consiglio...
Internal oxidation is a process in which oxygen diffuses into an alloy and reacts with solute to for...
A two-dimensional general hydrodynamic equation (HDE) solver has been developed. The solver is capab...
The two-dimensional isolation oxidation of silicon is considered for stress-dependent reaction and d...
Abstract — We present a sophisticated numerical model for the simulation of thermal oxidation on com...
Mathematical techniques for calculating the thickness of a grown oxide layer on Silicon nanowires (S...