Abstract Exponentially increasing with technology scaling, soft errors have become a serious design concern in the deep sub-micron embedded systems. Partially Pro-tected Cache (PPC) is a promising microarchitectural feature to mitigate failures due to soft errors in embedded processors. A processor with PPC maintains two caches, one protected and the other unprotected, both at the same level of memory hierarchy. By finding out the data more prone to soft errors and mapping only that to the protected cache, the failure rate can be significantly improved at minimal power and performance penalty. While the effectiveness of PPCs has been demonstrated on multimedia applications – where the multimedia data is inherently resilient to soft errors –...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
Abstract—With advances in process technology, soft errors are becoming an increasingly critical desi...
As device density grows, each transistor gets smaller and more fragile leading to an overall higher ...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
Low voltage operation and small device sizes reduce the critical charge stored in a SRAM cell making...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
The exponentially increasing occurrence of soft errors makes the optimization of reliability, perfor...
Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The ...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
Abstract—With advances in process technology, soft errors are becoming an increasingly critical desi...
As device density grows, each transistor gets smaller and more fragile leading to an overall higher ...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
Low voltage operation and small device sizes reduce the critical charge stored in a SRAM cell making...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
The exponentially increasing occurrence of soft errors makes the optimization of reliability, perfor...
Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The ...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...