Add to ORKGLow frequency current noise in unstressed/stressed thin oxide metal-oxide-semiconductor capacitor
Biomedical sensors use capacitance measurement for a variety of detection applications and capacitan...
Low-frequency noise measurements were performed on intrinsic low pressure chemical vapor deposited p...
Low-frequency noise in cadmium-selenide (CdSe) thin-film transistors (TFTs) has been studied over a ...
Noise has been measured in a number of biased solid tantalum capacitors at frequencies down to 0.01 ...
The transport mechanism of HfO2-based metal-ferroelectric-metal (MFM) capacitors was investigated us...
A low frequency noise and charge carriers transport mechanism analysis was performed on tantalum cap...
Low-frequency noise is studied in resistive-switching memories based on metal–oxide polymer diodes. ...
With the employment of ultrathin, high dielectric constant gate materials in advanced semiconductor ...
The low-frequency noise power spectral density of MOSFETs is decreased if the MOSFETs are periodical...
International audienceThe low-frequency noise of bottom-gate amorphous IGZO thin-film transistors is...
This paper describes the design of an automated system for low-noise measurement of low-frequency cu...
The reliability of oxide and reoxidized-nitrided oxide (RNO) gate dielectrics was examined by compar...
Abstract. State-of-the-art low-frequency and high-frequency noise performance and modeling in modern...
One common trend in switch-mode power supply, micro-processor, and digital circuit applications is t...
The potential of using low-frequency noise as a diagnostic tool for semiconductor material and devic...
Biomedical sensors use capacitance measurement for a variety of detection applications and capacitan...
Low-frequency noise measurements were performed on intrinsic low pressure chemical vapor deposited p...
Low-frequency noise in cadmium-selenide (CdSe) thin-film transistors (TFTs) has been studied over a ...
Noise has been measured in a number of biased solid tantalum capacitors at frequencies down to 0.01 ...
The transport mechanism of HfO2-based metal-ferroelectric-metal (MFM) capacitors was investigated us...
A low frequency noise and charge carriers transport mechanism analysis was performed on tantalum cap...
Low-frequency noise is studied in resistive-switching memories based on metal–oxide polymer diodes. ...
With the employment of ultrathin, high dielectric constant gate materials in advanced semiconductor ...
The low-frequency noise power spectral density of MOSFETs is decreased if the MOSFETs are periodical...
International audienceThe low-frequency noise of bottom-gate amorphous IGZO thin-film transistors is...
This paper describes the design of an automated system for low-noise measurement of low-frequency cu...
The reliability of oxide and reoxidized-nitrided oxide (RNO) gate dielectrics was examined by compar...
Abstract. State-of-the-art low-frequency and high-frequency noise performance and modeling in modern...
One common trend in switch-mode power supply, micro-processor, and digital circuit applications is t...
The potential of using low-frequency noise as a diagnostic tool for semiconductor material and devic...
Biomedical sensors use capacitance measurement for a variety of detection applications and capacitan...
Low-frequency noise measurements were performed on intrinsic low pressure chemical vapor deposited p...
Low-frequency noise in cadmium-selenide (CdSe) thin-film transistors (TFTs) has been studied over a ...