Abstract — Heat removal and power delivery are two major reliability concerns in the 3D stacked IC technology. Liquid cooling based on micro-fluidic channels is proposed as a viable solution to dramatically reduce the operating temperature of 3D ICs. In addition, designers use a highly complex hierarchical power distribution network in conjunction with decoupling capacitors to deliver currents to all parts of the 3D IC while suppressing the power supply noise to an acceptable level. These so called silicon ancillary technologies, however, pose major challenges to routing completion and congestion. These thermal and power/ground interconnects together with those used for signal delivery compete with one another for routing resources includin...
Abstract Compared to their 2D counterparts, 3D integrated circuits provide the potential for tremend...
The performance improvement of today's computer systems is usually accompanied by increased chip pow...
Vertical integration for microelectronics possesses significant challenges due to its fast dissip...
Abstract — Heat removal and power delivery are two major reliability concerns in the 3D stacked IC t...
With the rapid advance of enabling technologies, the era of 3D ICs is near. Yet, there are several p...
Heat removal and power delivery have become two major relia-bility concerns in 3D stacked IC technol...
This book describes the design of through-silicon-via (TSV) based three-dimensional integrated circu...
Three-dimensional integrated circuit (3D IC) technology has become a popular research topic to furth...
Abstract—With the rapid advance of die stacking and through-silicon-via fabrication technologies, th...
Abstract. 3D stacked chips have become a promising integration technology for modern systems. The co...
Abstract-Due to the increased power density and lower thermal conductivity, 3D is faced with heat di...
Three-dimensional integrated circuits (3D ICs) offer a promising solution to overcome the on-chip co...
In this paper a liquid cooling solution has been reported for 3-D package in PoP format. The high he...
An examination of large-scale stacking of 3D integrated ICs from a power-supply and thermal reliabil...
For decades, advances in device scaling has proven to be critical in improving the performance and p...
Abstract Compared to their 2D counterparts, 3D integrated circuits provide the potential for tremend...
The performance improvement of today's computer systems is usually accompanied by increased chip pow...
Vertical integration for microelectronics possesses significant challenges due to its fast dissip...
Abstract — Heat removal and power delivery are two major reliability concerns in the 3D stacked IC t...
With the rapid advance of enabling technologies, the era of 3D ICs is near. Yet, there are several p...
Heat removal and power delivery have become two major relia-bility concerns in 3D stacked IC technol...
This book describes the design of through-silicon-via (TSV) based three-dimensional integrated circu...
Three-dimensional integrated circuit (3D IC) technology has become a popular research topic to furth...
Abstract—With the rapid advance of die stacking and through-silicon-via fabrication technologies, th...
Abstract. 3D stacked chips have become a promising integration technology for modern systems. The co...
Abstract-Due to the increased power density and lower thermal conductivity, 3D is faced with heat di...
Three-dimensional integrated circuits (3D ICs) offer a promising solution to overcome the on-chip co...
In this paper a liquid cooling solution has been reported for 3-D package in PoP format. The high he...
An examination of large-scale stacking of 3D integrated ICs from a power-supply and thermal reliabil...
For decades, advances in device scaling has proven to be critical in improving the performance and p...
Abstract Compared to their 2D counterparts, 3D integrated circuits provide the potential for tremend...
The performance improvement of today's computer systems is usually accompanied by increased chip pow...
Vertical integration for microelectronics possesses significant challenges due to its fast dissip...