State of Art on the Tests for ΣΔ ADC

Abstract: The paper deals with the state of art on the tests for both ΣΔ modulators and ΣΔ Analog to Digital Converters (ADCs). Particular aspects are highlighted concerning the tests for the innovative architectures based on the Band Pass ΣΔ ADC. The analysis of the tests is carried out in conjunction with the discussion about the applicability of the procedures included into the IEEE Standard 1241. Therefore, three fundamental groups of tests are defined: (i) tests according to the IEEE Standard 1241, (ii) tests included into the IEEE Standard 1241 but executed in a different way from the Standard, and (iii) tests pointed out to evaluate the specific characteristics of the ΣΔ modulator not included into the IEEE Standard 1241