Increases in peak current draw and reductions in the operating volt-ages of processors continue to amplify the importance of dealing with voltage fluctuations in processors. Noise-margin violations lead to undesired effects, like timing violations, which may re-sult in incorrect execution of applications. To support future trends, several recent architectural solutions for inductive noise have been proposed that, unfortunately, have a strong correlation to the un-derlying power-delivery package model and require a feedback loop that is largely constrained by the voltage/current sensor speed and accuracy. The resulting solutions are not robust across a range of microprocessor designs and packaging technologies. This pa-per proposes a robust ...
With the continued scaling of chip manufacturing technologies, the significance of process variation...
Abstract—Voltage droops resulting from inductive noise are common in state-of-the-art processors. Ma...
While circuit and package designers have addressed microprocessor inductive noise issues in the past...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is...
Increasing focus on power dissipation issues in current microprocessors has led to a host of proposa...
Power delivery is a growing reliability concern in micropro-cessors as the industry moves toward fea...
As processor clock gating becomes more and more prevalent, the resulting processor current fluctuati...
Rising PVT variations at advanced process nodes make it increasingly difficult to meet aggressive pe...
Current processor designs have a critical operating point that sets a hard limit on voltage scaling....
textReliability is one of the important issues of recent microprocessor design. Processors must pro...
The Smartphone revolution and the Internet of Things (IoTs) have triggered rapid advances in complex...
With the continued scaling of chip manufacturing technologies, the significance of process variation...
Abstract—Voltage droops resulting from inductive noise are common in state-of-the-art processors. Ma...
While circuit and package designers have addressed microprocessor inductive noise issues in the past...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is...
Increasing focus on power dissipation issues in current microprocessors has led to a host of proposa...
Power delivery is a growing reliability concern in micropro-cessors as the industry moves toward fea...
As processor clock gating becomes more and more prevalent, the resulting processor current fluctuati...
Rising PVT variations at advanced process nodes make it increasingly difficult to meet aggressive pe...
Current processor designs have a critical operating point that sets a hard limit on voltage scaling....
textReliability is one of the important issues of recent microprocessor design. Processors must pro...
The Smartphone revolution and the Internet of Things (IoTs) have triggered rapid advances in complex...
With the continued scaling of chip manufacturing technologies, the significance of process variation...
Abstract—Voltage droops resulting from inductive noise are common in state-of-the-art processors. Ma...
While circuit and package designers have addressed microprocessor inductive noise issues in the past...