Add to ORKGA novel physical design tool, BISRAMGEN, that gen-erates layout geometries of parametrized built-in self-repairable SRAM modules, producing significant improve-ment in testability, reliability, production yield and manu-facturing cost of ASICs and microprocessors with embed-ded RAMs, is presented. Key words and phrases: Built-in self-repair (BISR), yield, reliability
The new generations of SRAM-based FPGA (Field Programmable Gate Array) devices, built on nanometre t...
Shrinking process technology has the advantage of lower area of Integrated Circuits I.C s . This has...
With the increasing demand of memories in system-on-chip (SOC) designs, developing efficient yield-i...
This research focuses on a CAD tool, BISRAMGEN, that synthesizes layout geometries of built-in self-...
Built-in self repair (BISR) for RAMs is an established and widely used approach to increase system-o...
In modern SOCs, embedded memories occupy the largest part of the chip area and include an even large...
Embedded random access memories (RAMs) are increasingly being tested using built-in self-test (BIST)...
Abstract- This paper proposes Built-In Self-Repair Analyzer (BISR) strategy with Redundancy which is...
Incorporating self-repair capabilities to memories is a standard practice to reduce yield loss from ...
The emerging field of self-repair computing is expected to have a major impact on deployable systems...
Built-in self -test (BIST) refers to those testing techniques where additional hardware is added to ...
As the density of embedded memory increases, manufacturing yields of integrated circuits can reach u...
[[abstract]]© 2007 Institute of Electrical and Electronics Engineers - The demand for built-in self-...
[[abstract]]We propose an embedded processor-based built-in self-repair (BISR) design for embedded m...
[[abstract]]Embedded memories are among the most widely used cores in current system-on-chip (SOC) i...
The new generations of SRAM-based FPGA (Field Programmable Gate Array) devices, built on nanometre t...
Shrinking process technology has the advantage of lower area of Integrated Circuits I.C s . This has...
With the increasing demand of memories in system-on-chip (SOC) designs, developing efficient yield-i...
This research focuses on a CAD tool, BISRAMGEN, that synthesizes layout geometries of built-in self-...
Built-in self repair (BISR) for RAMs is an established and widely used approach to increase system-o...
In modern SOCs, embedded memories occupy the largest part of the chip area and include an even large...
Embedded random access memories (RAMs) are increasingly being tested using built-in self-test (BIST)...
Abstract- This paper proposes Built-In Self-Repair Analyzer (BISR) strategy with Redundancy which is...
Incorporating self-repair capabilities to memories is a standard practice to reduce yield loss from ...
The emerging field of self-repair computing is expected to have a major impact on deployable systems...
Built-in self -test (BIST) refers to those testing techniques where additional hardware is added to ...
As the density of embedded memory increases, manufacturing yields of integrated circuits can reach u...
[[abstract]]© 2007 Institute of Electrical and Electronics Engineers - The demand for built-in self-...
[[abstract]]We propose an embedded processor-based built-in self-repair (BISR) design for embedded m...
[[abstract]]Embedded memories are among the most widely used cores in current system-on-chip (SOC) i...
The new generations of SRAM-based FPGA (Field Programmable Gate Array) devices, built on nanometre t...
Shrinking process technology has the advantage of lower area of Integrated Circuits I.C s . This has...
With the increasing demand of memories in system-on-chip (SOC) designs, developing efficient yield-i...