SUMMARY This paper proposes a soft-error model for accurately esti-mating reliability of a computer system at the architectural level within rea-sonable computation time. The architectural-level soft-error model identi-fies which part of memory modules are utilized temporally and spatially and which single event upsets (SEUs) are critical to the program execu-tion of the computer system at the cycle accurate instruction set simulation (ISS) level. The soft-error model is capable of estimating reliability of a computer system that has several memory hierarchies with it and finding which memory module is vulnerable in the computer system. Reliability estimation helps system designers apply reliable design techniques to vul-nerable part of the...
As the technology scales down and the number of circuits grows, the issue of soft errors and reliabi...
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
Defects in semiconductor memory chips and errors of their functioning are of interest to both manufa...
This paper proposes a simulation-based soft error esti-mation methodology for computer systems. Accu...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Minimizing the risk of system failure in any computer structure requires identifying those component...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors h...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
This paper concerns the validity of a widely used method for estimating the architecture-level mean ...
The Soft-Error (SE) reliability and the effects of Negative Bias Temperature Instability (NBTI) in d...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
The risks of soft errors increase with system complexity, reduction in operational voltages, exponen...
As the technology scales down and the number of circuits grows, the issue of soft errors and reliabi...
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
Defects in semiconductor memory chips and errors of their functioning are of interest to both manufa...
This paper proposes a simulation-based soft error esti-mation methodology for computer systems. Accu...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Minimizing the risk of system failure in any computer structure requires identifying those component...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors h...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
This paper concerns the validity of a widely used method for estimating the architecture-level mean ...
The Soft-Error (SE) reliability and the effects of Negative Bias Temperature Instability (NBTI) in d...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
The risks of soft errors increase with system complexity, reduction in operational voltages, exponen...
As the technology scales down and the number of circuits grows, the issue of soft errors and reliabi...
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
Defects in semiconductor memory chips and errors of their functioning are of interest to both manufa...