Abstract.We present a new decompression architecture suitable for embedded cores in SoCs which focuses on im-proving the download time by avoiding higher internal-to-ATE clock ratios and by exploiting hardware paral-lelism. The Bounded Huffman compression facilitates decompression hardware tradeoffs. Our technique is scal-able in that the downloadable RAM-based decode table and accommodates for different SoC cores with different characteristics such as the number of scan chains and test set data distributions.
textHuffman coding is a good method for statistically compressing test data with high compression ra...
Data compression is the reduction of redundancy in data representation in order to decrease storage ...
Includes bibliographical references (page 41)Before writing data to a storage medium or transmitting...
Symbol-based and linear-based test-data compression techniques have complementary properties which a...
We present a data compression method and decompres-sion architecture for testing embedded cores in a...
This paper describes a new compression/decompression methodology for using an embedded processor to ...
Modern semiconductor design methods makes it possible to design increasingly complex system-on-a-chi...
This paper describes a new compression/decompression methodology for using an embedded processor to ...
Synchronization overhead between the core under test and the automatic test equipment is the main dr...
A methodology for the determination of decompression hardware that guarantees complete fault coverag...
textSequential linear decompressors are widely used to implement test compression. Bits stored on th...
The paper presents a method for testing a system-on-achip by using a compressed representation of th...
Abstract—Systems-on-a-chip (SOCs) with many complex intellectual property cores require a large volu...
Test equipments have range from manual test equipments to fully automatic test equipments (ATE). The...
This thesis describes a test pattern compression scheme that reduces test time by using specific on-...
textHuffman coding is a good method for statistically compressing test data with high compression ra...
Data compression is the reduction of redundancy in data representation in order to decrease storage ...
Includes bibliographical references (page 41)Before writing data to a storage medium or transmitting...
Symbol-based and linear-based test-data compression techniques have complementary properties which a...
We present a data compression method and decompres-sion architecture for testing embedded cores in a...
This paper describes a new compression/decompression methodology for using an embedded processor to ...
Modern semiconductor design methods makes it possible to design increasingly complex system-on-a-chi...
This paper describes a new compression/decompression methodology for using an embedded processor to ...
Synchronization overhead between the core under test and the automatic test equipment is the main dr...
A methodology for the determination of decompression hardware that guarantees complete fault coverag...
textSequential linear decompressors are widely used to implement test compression. Bits stored on th...
The paper presents a method for testing a system-on-achip by using a compressed representation of th...
Abstract—Systems-on-a-chip (SOCs) with many complex intellectual property cores require a large volu...
Test equipments have range from manual test equipments to fully automatic test equipments (ATE). The...
This thesis describes a test pattern compression scheme that reduces test time by using specific on-...
textHuffman coding is a good method for statistically compressing test data with high compression ra...
Data compression is the reduction of redundancy in data representation in order to decrease storage ...
Includes bibliographical references (page 41)Before writing data to a storage medium or transmitting...