We report detailed reflectance studies of the exciton-polariton structure of thin film polycrystalline ZnO and comparison with bulk crystal behaviour. Near-normal incidence reflectance spectra of these samples are fitted using a two-band dielectric response function. Our data show that the reflectance data in polycrystalline ZnO differ substantially from the bulk material, with Fabry-Perot oscillations at energies below the transverse A exciton and above the longitudinal B exciton in the films. In the strong interaction regime between these energies no evidence is seen of the normally rapid oscillations associated with the anomalous waves. We demonstrate that the strong interaction of the damped exciton with the photon leads to polaritons i...
The oxygen- and zinc-terminated polar surfaces of ZnO bulk crystals are examined using both optical ...
At carrier densities above the Mott density Coulomb screening destroys the exciton resonance. This, ...
We report the results of photoluminescence and reflectance measurements on highly c-axis oriented po...
We report detailed reflectance studies of the exciton–polariton structure of thin film polycrystalli...
We report detailed reflectance studies of the exciton-polariton structure of thin film nanocrystalli...
Distinct coupling behavior of heavy- and light-hole excitonic polaritons in ZnO was unveiled by inve...
We report on the investigation and observation of Bloch surface wave polaritons, resulting from the ...
This article may be downloaded for personal use only. Any other use requires prior permission of the...
The temperature dependence of the band structure of ZnO has been studied on epitaxial films and bulk...
Raman spectroscopy, x-ray diffractometry, atomic force microscopy, photoluminescence spectroscopy an...
We have investigated the photoluminescence (PL) dynamics of ZnO thin films under intense e...
In this work, an analytical expression for the complex dielectric function is proposed, which includ...
The first observation of Raman scattering from the upper branch polariton in a semiconductor is repo...
The characterization by various experimental techniques of homoepitaxial growth and photonic propert...
By employing time-of-flight spectroscopy, the group velocity of light propagating through bulk ZnO i...
The oxygen- and zinc-terminated polar surfaces of ZnO bulk crystals are examined using both optical ...
At carrier densities above the Mott density Coulomb screening destroys the exciton resonance. This, ...
We report the results of photoluminescence and reflectance measurements on highly c-axis oriented po...
We report detailed reflectance studies of the exciton–polariton structure of thin film polycrystalli...
We report detailed reflectance studies of the exciton-polariton structure of thin film nanocrystalli...
Distinct coupling behavior of heavy- and light-hole excitonic polaritons in ZnO was unveiled by inve...
We report on the investigation and observation of Bloch surface wave polaritons, resulting from the ...
This article may be downloaded for personal use only. Any other use requires prior permission of the...
The temperature dependence of the band structure of ZnO has been studied on epitaxial films and bulk...
Raman spectroscopy, x-ray diffractometry, atomic force microscopy, photoluminescence spectroscopy an...
We have investigated the photoluminescence (PL) dynamics of ZnO thin films under intense e...
In this work, an analytical expression for the complex dielectric function is proposed, which includ...
The first observation of Raman scattering from the upper branch polariton in a semiconductor is repo...
The characterization by various experimental techniques of homoepitaxial growth and photonic propert...
By employing time-of-flight spectroscopy, the group velocity of light propagating through bulk ZnO i...
The oxygen- and zinc-terminated polar surfaces of ZnO bulk crystals are examined using both optical ...
At carrier densities above the Mott density Coulomb screening destroys the exciton resonance. This, ...
We report the results of photoluminescence and reflectance measurements on highly c-axis oriented po...