Many undergraduate programs in electronic engineering include a one semester course in semiconductor devices. In this course the student is introduced to lumped physical models that are derived from solid-state physics, statistical mechanics and electrostatics for the operating characteristics of transistors and other semiconductor devices. Among the many concepts taught is that the drain-to-source voltage that causes the current flow in an MOS transistor to saturate ( dsI ∂ / 0Vds → ∂ ) is given by the simple mathematical expression T gsdsat VVV − =. However, this simple expression is widely misapplied by both students and professionals to nanoscale MOS transistors used in modern high-performance microelectronic circuits. This work descri...
Polysilicon gate depletion is an important eect that degrades the circuit performance of deep submic...
The modeling of nano-ballistic carrier transport nature across the nanoscale channel of a MOSFET bas...
This paper covers the fundamentals of SDGFETs and ADGFETs. Drain modern fashions for unmarried gate ...
Stress engineering is widely used in the microelectronics industry to improve the on-current (Ion) p...
MOSFET scaling throughout the years has enabled us to pack million of MOS transistors on a single ch...
One-dimensional analysis is used to find an upper and lower bound to the drain current of MOS transi...
As MOS devices scale to submicron lengths, short-channel effects become more pronounced, and an impr...
The intrinsic velocity is shown to be the ultimate limit to the saturation velocity in a very high e...
Quasi-saturation in power VDMOS transistors happens for large gate voltage. The associated current l...
Abstract-An engineering model for short-channel MOS devices which includes the effect of carrier dri...
The properties of the transconductance, at saturation, in short-channel MOSFET's are studied as a fu...
Texto completo: acesso restrito. p.1510-1519This paper presents a physically based model for the met...
We investigate the hysteresis and gate voltage stress effect in MoS2 field effect transistors (FETs)...
A simple but reasonably accurate model is presented for the saturation voltage and current of submic...
Des calculs analytiques détaillées, à partir de quelques modèles physiques de base, prouvent que le ...
Polysilicon gate depletion is an important eect that degrades the circuit performance of deep submic...
The modeling of nano-ballistic carrier transport nature across the nanoscale channel of a MOSFET bas...
This paper covers the fundamentals of SDGFETs and ADGFETs. Drain modern fashions for unmarried gate ...
Stress engineering is widely used in the microelectronics industry to improve the on-current (Ion) p...
MOSFET scaling throughout the years has enabled us to pack million of MOS transistors on a single ch...
One-dimensional analysis is used to find an upper and lower bound to the drain current of MOS transi...
As MOS devices scale to submicron lengths, short-channel effects become more pronounced, and an impr...
The intrinsic velocity is shown to be the ultimate limit to the saturation velocity in a very high e...
Quasi-saturation in power VDMOS transistors happens for large gate voltage. The associated current l...
Abstract-An engineering model for short-channel MOS devices which includes the effect of carrier dri...
The properties of the transconductance, at saturation, in short-channel MOSFET's are studied as a fu...
Texto completo: acesso restrito. p.1510-1519This paper presents a physically based model for the met...
We investigate the hysteresis and gate voltage stress effect in MoS2 field effect transistors (FETs)...
A simple but reasonably accurate model is presented for the saturation voltage and current of submic...
Des calculs analytiques détaillées, à partir de quelques modèles physiques de base, prouvent que le ...
Polysilicon gate depletion is an important eect that degrades the circuit performance of deep submic...
The modeling of nano-ballistic carrier transport nature across the nanoscale channel of a MOSFET bas...
This paper covers the fundamentals of SDGFETs and ADGFETs. Drain modern fashions for unmarried gate ...