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In recent years, X-ray imaging has been literally revolutionized by the exploitation of the unique characteristics of synchrotron sources. In particular, the high spatial coherence of the radiation significantly contributes to the development of advanced and powerful X-ray imaging. The results are very high quality microradiology and microtomography images and movies- taken with a limited X-ray dose – that find a variety of applications in materials science, biology and medical research. In this talk we review basic theory and selected applications of phase contrast X-ray imaging to materials and biomedical sciences. Furthermore we introduce a new strategy of combining phase contrast radiology and diffraction X-ray microscopy to visualize atomic level defects such as misfit dislocations and micropipes in semiconductor single crystals. Finally phase contrast X-ray imaging in nanometer-resolution (< 30 nm) will be demonstrated. 1