Add to ORKGA reconfiguralbe device can be utilized to enhance speed and yield on the sub-100nm device technologies, in which large within-die (WID) variations will degrade speed and cause huge yield loss in conventional fixed-structured ASICs. In the proposed scheme, configurations of all fabricated chips are optmized according to measured intra variations of LUTs and switch matrixes. Two LSIs are fabricated in a 90nm CMOS process. We successfully measured WID variations on the first LUT array LSI. The speed is enhanced by 4.1% in average on the second variation-aware FPGA LSIs to opt-mize configurations by the measured WID variations. 1
Yang, ChengmoField Programmable Gate Arrays (FPGAs) are programmable logic blocks based circuit dev...
Process variations are a major bottleneck for digital CMOS integrated circuits manufacturability an...
Increasing variability in today's manufacturing processes causes parametric yield loss that increase...
Abstract — It is possible to enhance speed and yield of reconfigurable devices utilizing WID variati...
Abstract — We have fabricated an LUT-based FPGA device with functionalities measuring within-die var...
Chip design in the nanometer regime is becoming increasingly difficult due to process variations. AS...
ABSTRACT Chip design in the nanometer regime is becoming increasingly difficult due to process varia...
A novel technique for the enhancement of yield and speed of semiconductor integrated circuits using ...
Scaling of CMOS technology into the deep-submicron regime has made superior device performance and h...
SUMMARY We propose guidelines for LSI-chip design, taking the within-die variations into considerati...
The mitigation of process variability becomes paramount as chip fabrication advances deeper into the...
This paper discusses the issues of FPGA reconfigurable memory system with faulty physical memory cel...
For field-programmable gate arrays (FPGAs), fine-grained pre-computed alternative configurations, co...
Technology scaling improves the energy, performance, and area of the digital circuits. With further ...
Both random and systematic within-die process variations (PV) are growing more severe with shrinking...
Yang, ChengmoField Programmable Gate Arrays (FPGAs) are programmable logic blocks based circuit dev...
Process variations are a major bottleneck for digital CMOS integrated circuits manufacturability an...
Increasing variability in today's manufacturing processes causes parametric yield loss that increase...
Abstract — It is possible to enhance speed and yield of reconfigurable devices utilizing WID variati...
Abstract — We have fabricated an LUT-based FPGA device with functionalities measuring within-die var...
Chip design in the nanometer regime is becoming increasingly difficult due to process variations. AS...
ABSTRACT Chip design in the nanometer regime is becoming increasingly difficult due to process varia...
A novel technique for the enhancement of yield and speed of semiconductor integrated circuits using ...
Scaling of CMOS technology into the deep-submicron regime has made superior device performance and h...
SUMMARY We propose guidelines for LSI-chip design, taking the within-die variations into considerati...
The mitigation of process variability becomes paramount as chip fabrication advances deeper into the...
This paper discusses the issues of FPGA reconfigurable memory system with faulty physical memory cel...
For field-programmable gate arrays (FPGAs), fine-grained pre-computed alternative configurations, co...
Technology scaling improves the energy, performance, and area of the digital circuits. With further ...
Both random and systematic within-die process variations (PV) are growing more severe with shrinking...
Yang, ChengmoField Programmable Gate Arrays (FPGAs) are programmable logic blocks based circuit dev...
Process variations are a major bottleneck for digital CMOS integrated circuits manufacturability an...
Increasing variability in today's manufacturing processes causes parametric yield loss that increase...