In the paper, it is shown how testability analysis can be used both to modify digital data path for maximize testability at minimal costs and to offer information applicable during automated synthesis of a controller used to apply a test to the modified data path
[[abstract]]The purpose of a testability analysis program is to estimate the difficulty of testing a...
International audienceWe present a behavioral synthesis method aimed at generating testabledatapaths...
A high level synthesis for testability method is presented with the objective to generate testable r...
In this paper, we present a method for analyzing the testability of a circuit during high level synt...
Testability is one of the most important factors that are considered during design cycle along with ...
This paper presents a testability analysis and improvement technique for the controller of an RT lev...
This paper proposes a test syntheses method for datapaths. The proposed method goes on design-for-te...
Area and test time are two major overheads encountered during data path synthesis for BIST. This pap...
This paper presents a method to carry out the register allocation/binding phase of a High Level Synt...
In this thesis, a behavioral-level testability analysis approach is presented. This approach is base...
Optimal application of Design for Testability techniques extends on an efficient testability analysi...
A testability transformation is a source-to-source transformation that aims to improve the ability o...
This thesis belongs to the domain of hardware synthesis for testability. The objective of our work w...
International audienceThis paper gives an overview of the IDAT system, based on Interactive Design f...
This thesis presents a new approach to building a design for testability (DFT) system. The system ...
[[abstract]]The purpose of a testability analysis program is to estimate the difficulty of testing a...
International audienceWe present a behavioral synthesis method aimed at generating testabledatapaths...
A high level synthesis for testability method is presented with the objective to generate testable r...
In this paper, we present a method for analyzing the testability of a circuit during high level synt...
Testability is one of the most important factors that are considered during design cycle along with ...
This paper presents a testability analysis and improvement technique for the controller of an RT lev...
This paper proposes a test syntheses method for datapaths. The proposed method goes on design-for-te...
Area and test time are two major overheads encountered during data path synthesis for BIST. This pap...
This paper presents a method to carry out the register allocation/binding phase of a High Level Synt...
In this thesis, a behavioral-level testability analysis approach is presented. This approach is base...
Optimal application of Design for Testability techniques extends on an efficient testability analysi...
A testability transformation is a source-to-source transformation that aims to improve the ability o...
This thesis belongs to the domain of hardware synthesis for testability. The objective of our work w...
International audienceThis paper gives an overview of the IDAT system, based on Interactive Design f...
This thesis presents a new approach to building a design for testability (DFT) system. The system ...
[[abstract]]The purpose of a testability analysis program is to estimate the difficulty of testing a...
International audienceWe present a behavioral synthesis method aimed at generating testabledatapaths...
A high level synthesis for testability method is presented with the objective to generate testable r...