Core based design has become the de-facto design style for many VLSI design houses, as it facilitates design reuse, import of specialized expertise from external vendors and leads to a more streamlined design flow. Pre-designed cores and reusable modules are popularly used in the design of large and complex Systems-on-a-Chip (SOC). Embedded cores such as processors, custom application-specific integrated circuits (ASIC), and memories are being used to provide SOC solutions to complex integrated circuit design problems. Traditional approaches for testing core-based SOCs completely rely on additional test structures such as boundary sca
This paper presents an efficient approach for the test scheduling problem of core-based systems base...
A test architecture for an SOC consists of a number of Test Access Mechanisms that connect to wrappe...
In a Core based SoC design various Intellectual Property (IP) cores are integrated on a single chip ...
Testing of embedded cores is very dicult in SOC (system-on-a-chip), since the core user may not know...
Advances in semiconductor process and design technology enable the design of complex system chips. T...
Recently, designers have been embedding reusable modules to build on-chip systems that form rich lib...
Addresses the design challenges associated with generations of the semiconductor technology. This bo...
[[abstract]]©2001 CIEE-With the advent of deep-submicron technologies, system-on-chip (SOC) designs,...
Advances in the semiconductor process technology enable the creation of a complete system on one sin...
Test access mechanism (TAM) is an important element of test access architectures for embedded cores ...
Rapid advances in integration technology have tremendously increased the design complexity of very l...
Spurred by technology leading to the availability of millions of gates per chip, system-level integr...
Abstract — This tutorial responds to the rapidly increasing use of various cores for implementing sy...
The test access mechanism (TAM) is an important element of test architectures for embedded cores and...
Abstract — Test access mechanism (TAM) is an important element of test access architectures for embe...
This paper presents an efficient approach for the test scheduling problem of core-based systems base...
A test architecture for an SOC consists of a number of Test Access Mechanisms that connect to wrappe...
In a Core based SoC design various Intellectual Property (IP) cores are integrated on a single chip ...
Testing of embedded cores is very dicult in SOC (system-on-a-chip), since the core user may not know...
Advances in semiconductor process and design technology enable the design of complex system chips. T...
Recently, designers have been embedding reusable modules to build on-chip systems that form rich lib...
Addresses the design challenges associated with generations of the semiconductor technology. This bo...
[[abstract]]©2001 CIEE-With the advent of deep-submicron technologies, system-on-chip (SOC) designs,...
Advances in the semiconductor process technology enable the creation of a complete system on one sin...
Test access mechanism (TAM) is an important element of test access architectures for embedded cores ...
Rapid advances in integration technology have tremendously increased the design complexity of very l...
Spurred by technology leading to the availability of millions of gates per chip, system-level integr...
Abstract — This tutorial responds to the rapidly increasing use of various cores for implementing sy...
The test access mechanism (TAM) is an important element of test architectures for embedded cores and...
Abstract — Test access mechanism (TAM) is an important element of test access architectures for embe...
This paper presents an efficient approach for the test scheduling problem of core-based systems base...
A test architecture for an SOC consists of a number of Test Access Mechanisms that connect to wrappe...
In a Core based SoC design various Intellectual Property (IP) cores are integrated on a single chip ...