Mesoscopic structures on length scales of 10 nm to 1000 nm are of high interest for the study of nanostrucured surfaces and thin films. Such structures can be analyzed with the help of high-resolution x-ray scattering using crystal optics. In order to improve the speed of data collection, it is convenient to combine the analyzer crystal with a linear detector. A simple analytical theory in angular space is presented, how to correct distortions in intensity maps obtained this a way, and how to optimize the accessible angular range. The anisotropic resolution that can be achieved with this combination – high-resolution scattering in the sample plane, large scattering range normal to the surface – is useful for grazing-incidence small-angle sc...
The equations taking into account refraction at the sample surface in grazing-incidence small-angle ...
Surface sensitive X-ray scattering methods are mostly non-destructive tools which are frequently use...
The small-angle X-ray scattering (SAXS) intensity obtained in the transmission mode is very weak for...
The peculiarities of high-resolution measurements in grazing-incidence diffraction (GID) are studied...
X-ray diffraction represents the classical method for determining the crystalline structure of solid...
Grazing incidence scattering, sometimes Grazing Incidence Diffraction (GID) or Grazing Incidence X-r...
The complex nano-morphology of modern soft-matter materials is successfully probed with advanced gra...
A new scattering technique in grazing-incidence X-ray diffraction geometry is described which enable...
The semiconductor industry is continuously pushing the limits of photolithography, with feature size...
The present paper focuses on the analysis of grazing incidence small-angle x-ray scattering (GISAXS)...
Insights into the micro- and nano-architecture of materials is crucial for understanding and predict...
Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using a...
By the use of grazing incidence scattering geometries and a triplecrystal x-ray diffractometer, x-ra...
Small-angle X-ray scattering (SAXS) is generally not applicable to thin (∼1 µm) films and...
Grazing-incidence X-ray diffraction (GID) is a well known technique for the characterization of crys...
The equations taking into account refraction at the sample surface in grazing-incidence small-angle ...
Surface sensitive X-ray scattering methods are mostly non-destructive tools which are frequently use...
The small-angle X-ray scattering (SAXS) intensity obtained in the transmission mode is very weak for...
The peculiarities of high-resolution measurements in grazing-incidence diffraction (GID) are studied...
X-ray diffraction represents the classical method for determining the crystalline structure of solid...
Grazing incidence scattering, sometimes Grazing Incidence Diffraction (GID) or Grazing Incidence X-r...
The complex nano-morphology of modern soft-matter materials is successfully probed with advanced gra...
A new scattering technique in grazing-incidence X-ray diffraction geometry is described which enable...
The semiconductor industry is continuously pushing the limits of photolithography, with feature size...
The present paper focuses on the analysis of grazing incidence small-angle x-ray scattering (GISAXS)...
Insights into the micro- and nano-architecture of materials is crucial for understanding and predict...
Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using a...
By the use of grazing incidence scattering geometries and a triplecrystal x-ray diffractometer, x-ra...
Small-angle X-ray scattering (SAXS) is generally not applicable to thin (∼1 µm) films and...
Grazing-incidence X-ray diffraction (GID) is a well known technique for the characterization of crys...
The equations taking into account refraction at the sample surface in grazing-incidence small-angle ...
Surface sensitive X-ray scattering methods are mostly non-destructive tools which are frequently use...
The small-angle X-ray scattering (SAXS) intensity obtained in the transmission mode is very weak for...