Advantages and disadvantages of the alternative approaches to the dopant diffusion simulation are discussed. Complementary use of the Monte Carlo and continuum diffusion models is suggested. Application of the integrated commercially available process simulation tools DADOS (atomistic) and Taurus Process (continuum) to the advanced sub-100 nm devices is demonstrated. The following four application areas for the Monte Carlo diffusion model are discussed: 1. Determining model parameters for the continuum process simulation. 2. Complete Monte Carlo path from implantation to diffusion for investigating statistical device variations. 3. Usage of DADOS integrated into Taurus Process for the accurate diffusion simulation in the entire simulation d...
During the last few years, process simulation has become a valuable tool for the optimization of sem...
In this paper we present a methodology for the integrated atomistic process and device simulation of...
The contribution is mainly related to advanced problems in Monte Carlo simulations. The first sectio...
Abstract A Monte Carlo dopant diffusion simulation program has been developed which includes charged...
Simulation of diffusion processes during front-end silicon process steps needs to address a variety ...
The continuous scaling of electron devices places strong demands on device design and simulation. Th...
A theoretical analysis of a Monte Carlo (MC) method for the simulation of the diffusion-growth of he...
This paper describes a methodology of TCAD application in VLSI design and development. Simulation-ba...
of complicated stochastic models such as the diffusion process, simulations of the model play an imp...
The uniform-acceptance force-bias Monte Carlo (UFMC) method [G. Dereli, Mol. Simul. 8, 351 (1992)] i...
The workshop is composed of two main parts: the first part devoted to atomistic Monte Carlo simulati...
Classical molecular dynamics simulations are used to study damage produced during implantation of se...
Thesis (Ph.D.)--University of Washington, 2012As semiconductor device technology continues to evolve...
Introduction Conventional algorithms for semiconductor device modeling are based on steady-state tra...
port simulation oers the possibility to ex-tract information about all quantities deriv-able from th...
During the last few years, process simulation has become a valuable tool for the optimization of sem...
In this paper we present a methodology for the integrated atomistic process and device simulation of...
The contribution is mainly related to advanced problems in Monte Carlo simulations. The first sectio...
Abstract A Monte Carlo dopant diffusion simulation program has been developed which includes charged...
Simulation of diffusion processes during front-end silicon process steps needs to address a variety ...
The continuous scaling of electron devices places strong demands on device design and simulation. Th...
A theoretical analysis of a Monte Carlo (MC) method for the simulation of the diffusion-growth of he...
This paper describes a methodology of TCAD application in VLSI design and development. Simulation-ba...
of complicated stochastic models such as the diffusion process, simulations of the model play an imp...
The uniform-acceptance force-bias Monte Carlo (UFMC) method [G. Dereli, Mol. Simul. 8, 351 (1992)] i...
The workshop is composed of two main parts: the first part devoted to atomistic Monte Carlo simulati...
Classical molecular dynamics simulations are used to study damage produced during implantation of se...
Thesis (Ph.D.)--University of Washington, 2012As semiconductor device technology continues to evolve...
Introduction Conventional algorithms for semiconductor device modeling are based on steady-state tra...
port simulation oers the possibility to ex-tract information about all quantities deriv-able from th...
During the last few years, process simulation has become a valuable tool for the optimization of sem...
In this paper we present a methodology for the integrated atomistic process and device simulation of...
The contribution is mainly related to advanced problems in Monte Carlo simulations. The first sectio...