Flip Chip bonding is widely being used in the microelectronic industry as the method for interconnection. Various methods of flip chip bonding and underfill are presently in use. Acoustic micro imaging has been used since early in the development of flip chips to evaluate the quality of the bump bonds as well as the quality of the underfill. The focus of AMI up to now was to accommodate various thickness of the silicon chips with varying back surface roughness of the chips and still maintain sufficient resolution in the acoustic images to see the interconnects and small features in the underfill. In some cases the imaging technique has to accommodate the flip chip substrates in order to detect the bonds. Currently the aim is to provide tran...
In manufacturing of microelectronic components, non-destructive failure analysis methods are importa...
Edge effect is a common phenomenon observed in Acoustic micro imaging of microelectronic packages. I...
In acoustic micro imaging of microelectronic packages, edge effect is often presented as artifacts o...
Acoustic Micro Imaging has been used over the past years to successfully evaluate the quality of fli...
AbstractUsing a flip chip configuration to interconnect a die with its substrate gives the device a ...
Solder bump technology is being used increasingly as a method of interconnection of chips or package...
Flip chip technology is being used increasingly as a method of interconnecting a die to a substrate....
In this paper the performance of multi-narrow-band spectral analysis was evaluated concerning defect...
Flip chip packages offer a very high level of input/output (I/O) density together with miniaturizati...
Industrial applications often require failure analysis methods working non-destructively, enabling e...
Acoustic Micro Imaging (AMI) has become an established method to evaluate the quality and reliabilit...
Industrial applications often require failure analysis methods working non-destructively, enabling e...
A variety of flip chip technologies are available today which differ in bumping material, substrate ...
Recently we adapted two nondestructive testing techniques for the evaluation of electrical connectio...
Surface mount technology has spurred a rapid decrease in the size of electronic packages, where sold...
In manufacturing of microelectronic components, non-destructive failure analysis methods are importa...
Edge effect is a common phenomenon observed in Acoustic micro imaging of microelectronic packages. I...
In acoustic micro imaging of microelectronic packages, edge effect is often presented as artifacts o...
Acoustic Micro Imaging has been used over the past years to successfully evaluate the quality of fli...
AbstractUsing a flip chip configuration to interconnect a die with its substrate gives the device a ...
Solder bump technology is being used increasingly as a method of interconnection of chips or package...
Flip chip technology is being used increasingly as a method of interconnecting a die to a substrate....
In this paper the performance of multi-narrow-band spectral analysis was evaluated concerning defect...
Flip chip packages offer a very high level of input/output (I/O) density together with miniaturizati...
Industrial applications often require failure analysis methods working non-destructively, enabling e...
Acoustic Micro Imaging (AMI) has become an established method to evaluate the quality and reliabilit...
Industrial applications often require failure analysis methods working non-destructively, enabling e...
A variety of flip chip technologies are available today which differ in bumping material, substrate ...
Recently we adapted two nondestructive testing techniques for the evaluation of electrical connectio...
Surface mount technology has spurred a rapid decrease in the size of electronic packages, where sold...
In manufacturing of microelectronic components, non-destructive failure analysis methods are importa...
Edge effect is a common phenomenon observed in Acoustic micro imaging of microelectronic packages. I...
In acoustic micro imaging of microelectronic packages, edge effect is often presented as artifacts o...