Abstract. Texture characterization of intermetallic materials implies to solve the problem of overlapped pole figures of one or several phases when they are carried out by X-ray or neutron diffraction. Moreover, if the harmonic method is used to calculate the texture function, a complementary iterative method must be introduced to define the total texture function. A second iterative method must still be used to solve the problem of incomplete pole tigures measured by X-ray diffraction in reflection. An other approach consists in using individual orientation measurements, which allow to estimate the local texture which can be correlated to the microstructure but also to the global one if the orientation number is sufficient. 1
The application of Rietveld texture analysis (RTA) to time-of-flight (TOF) neutron diffraction data ...
The procedure to perform Rietveld texture analysis from diffraction images collected with CCDs or im...
A fast and accurate method has been developed for measuring crystalline texture in homogeneous mater...
Texture characterization of intermetallic materials implies to solve the problem of overlapped pole ...
In material science, crystallographic texture is an important microstructural parameter which direct...
Neutron diffraction methods for texture analysis are closely parallel to well-known X-ray diffractio...
This paper describes in detail the method of texture determination using neutron diffraction. The ma...
TEXTURE MEASUREMENT BY NEUTRON DIFFRACTION FORA1 NONSTANDARD STEEL BARS. Texture measurements are us...
The preferred orientation of crystal grains within a manufactured part is described most fully by it...
Abstract. Orientation distributions of polyphased (Bi,Pb)2Sr2Ca2Cu3O10+δ superconducting textured ma...
Neutron diffraction techniques are suitable for volume texture analyses due to high penetration of t...
Texture analysis by diffraction methods has greatly advanced in the last few years because of instru...
Reprint from Textures and Microstructures, 1989, v. 10 p. 325-346 / FIZ - Fachinformationszzentrum K...
Most of all solid materials are polycrystalline, often also polyphase. They consists of very many, s...
The textures of an Al thin film and of alpha-MnS nanocrystals deposited on a carbon film grid have b...
The application of Rietveld texture analysis (RTA) to time-of-flight (TOF) neutron diffraction data ...
The procedure to perform Rietveld texture analysis from diffraction images collected with CCDs or im...
A fast and accurate method has been developed for measuring crystalline texture in homogeneous mater...
Texture characterization of intermetallic materials implies to solve the problem of overlapped pole ...
In material science, crystallographic texture is an important microstructural parameter which direct...
Neutron diffraction methods for texture analysis are closely parallel to well-known X-ray diffractio...
This paper describes in detail the method of texture determination using neutron diffraction. The ma...
TEXTURE MEASUREMENT BY NEUTRON DIFFRACTION FORA1 NONSTANDARD STEEL BARS. Texture measurements are us...
The preferred orientation of crystal grains within a manufactured part is described most fully by it...
Abstract. Orientation distributions of polyphased (Bi,Pb)2Sr2Ca2Cu3O10+δ superconducting textured ma...
Neutron diffraction techniques are suitable for volume texture analyses due to high penetration of t...
Texture analysis by diffraction methods has greatly advanced in the last few years because of instru...
Reprint from Textures and Microstructures, 1989, v. 10 p. 325-346 / FIZ - Fachinformationszzentrum K...
Most of all solid materials are polycrystalline, often also polyphase. They consists of very many, s...
The textures of an Al thin film and of alpha-MnS nanocrystals deposited on a carbon film grid have b...
The application of Rietveld texture analysis (RTA) to time-of-flight (TOF) neutron diffraction data ...
The procedure to perform Rietveld texture analysis from diffraction images collected with CCDs or im...
A fast and accurate method has been developed for measuring crystalline texture in homogeneous mater...