This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion of the mixed-signal device, as the digital portion is handled in the usual way. We begin by first outlining the role of test in a manufacturing environment, and its impact on product cost and quality. We will look at the impact of manufacturing defects on the behavior of digital and analog circuits. Subsequently, we will argue that analog circuits require very different test methods than those presently used to test digital circuits. We will then describe four common analog test methods and their measurement setups. We will also describe how analog testing can be accomplished using digital sampling techniques. Finally, we shall close this tuto...
Consumers are demanding more and more value for each dollar spent on new electronic equipment. Built...
International audienceMuch progress has been achieved in the domain of Analog/Mixed-Signal (AMS) and...
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue...
This paper presents a discussion on several methods that can be used to improve the testability of m...
The increasing importance of next generation test technology to provide high quality, low cost fault...
This chapter presents several design methods that can be used to improve the testability of mixed-si...
The work described in this thesis is aimed at the exploration of new methods for the integration of ...
Recent advances in technology are leading to increases in the complexity and applications of analogu...
In contrast to the large number of logic gates and storage circuits encountered in digital networks,...
© 2014 IEEE. Electronics are increasingly being embedded in a growing number of applications in our ...
The tester’s features include a timing interval analyzer for statistical analysis of clock periods, ...
Thesis (Ph. D.)--University of Washington, 1999Industry trends aimed at procuring greater levels of ...
Semiconductor processing and packaging technologies inevitably result in the fabrication of a number...
In this paper, a new procedure to derive testability measures is presented. Digital testability can ...
A robust method has been developed for the test and characterization of analog and mixed-signal inte...
Consumers are demanding more and more value for each dollar spent on new electronic equipment. Built...
International audienceMuch progress has been achieved in the domain of Analog/Mixed-Signal (AMS) and...
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue...
This paper presents a discussion on several methods that can be used to improve the testability of m...
The increasing importance of next generation test technology to provide high quality, low cost fault...
This chapter presents several design methods that can be used to improve the testability of mixed-si...
The work described in this thesis is aimed at the exploration of new methods for the integration of ...
Recent advances in technology are leading to increases in the complexity and applications of analogu...
In contrast to the large number of logic gates and storage circuits encountered in digital networks,...
© 2014 IEEE. Electronics are increasingly being embedded in a growing number of applications in our ...
The tester’s features include a timing interval analyzer for statistical analysis of clock periods, ...
Thesis (Ph. D.)--University of Washington, 1999Industry trends aimed at procuring greater levels of ...
Semiconductor processing and packaging technologies inevitably result in the fabrication of a number...
In this paper, a new procedure to derive testability measures is presented. Digital testability can ...
A robust method has been developed for the test and characterization of analog and mixed-signal inte...
Consumers are demanding more and more value for each dollar spent on new electronic equipment. Built...
International audienceMuch progress has been achieved in the domain of Analog/Mixed-Signal (AMS) and...
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue...