Abstract − The presence of additive noise in an analogue to digital converter test setup or in the converter itself causes a bias in the estimation of its gain and offset error when using the Histogram Test Method. This will be demonstrated here by analytically determining the estimation error as a function of the sinusoidal stimulus signal amplitude and the noise standard deviation. A closed form approximate expression will be proposed for the computation of the bias. The results presented are numerically validated using a Monte Carlo procedure
International audienceThis paper presents background offset and gain calibration for time-interleave...
A method is described to eliminate the effects of differential nonlinearities of analog-to-digital c...
In this paper, new state of the art analog-to-digital converters (ADCs) testing techniques both stat...
The Histogram Test method is a popular technique in analog-to-digital converter (ADC) testing. The p...
The Histogram Test method is a popular technique in analog-to-digital converter (ADC) testing. The p...
Abstract—Two of the parameters that are determined when testing an analog to digital converter are t...
Abstract: We present here expressions to determine the uncertainty interval of the estimates of tran...
Abstract- This paper deals with some error effects caused by additive noise at analog-to-digital con...
In this paper an overview of the uncertainty in the results obtained with the histogram test of Anal...
Abstract—In this paper, the calculation of the variance in the number of counts of the cumulative hi...
Abstract-Based on a model of a test signal generator, an accuracy estimator was designed and impleme...
Abstract – One method to characterize ADCs is to use a histogram, where Gaussian noise may be used a...
Abstract − The random noise test of analogue to digital converters recommended by the IEEE 1057-2007...
The paper presents an analysis of the statistical efficiency of the sinewave histogram test used for...
Time-interleaving Analog-to-Digital Converters allows for increased sampling rates at the cost of a...
International audienceThis paper presents background offset and gain calibration for time-interleave...
A method is described to eliminate the effects of differential nonlinearities of analog-to-digital c...
In this paper, new state of the art analog-to-digital converters (ADCs) testing techniques both stat...
The Histogram Test method is a popular technique in analog-to-digital converter (ADC) testing. The p...
The Histogram Test method is a popular technique in analog-to-digital converter (ADC) testing. The p...
Abstract—Two of the parameters that are determined when testing an analog to digital converter are t...
Abstract: We present here expressions to determine the uncertainty interval of the estimates of tran...
Abstract- This paper deals with some error effects caused by additive noise at analog-to-digital con...
In this paper an overview of the uncertainty in the results obtained with the histogram test of Anal...
Abstract—In this paper, the calculation of the variance in the number of counts of the cumulative hi...
Abstract-Based on a model of a test signal generator, an accuracy estimator was designed and impleme...
Abstract – One method to characterize ADCs is to use a histogram, where Gaussian noise may be used a...
Abstract − The random noise test of analogue to digital converters recommended by the IEEE 1057-2007...
The paper presents an analysis of the statistical efficiency of the sinewave histogram test used for...
Time-interleaving Analog-to-Digital Converters allows for increased sampling rates at the cost of a...
International audienceThis paper presents background offset and gain calibration for time-interleave...
A method is described to eliminate the effects of differential nonlinearities of analog-to-digital c...
In this paper, new state of the art analog-to-digital converters (ADCs) testing techniques both stat...
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