Abstract:- The paper proposes a procedure to calculate the sensitivity factors of the quiescent drain current of a FET operating in the active region in conjunction with a general-purpose circuit simulator. Unlike the procedure developed for the sensitivity factors of the quiescent collector current in BJT, this one is not based on the drain current expression of the FET. We showed that the sensitivity factors of the quiescent drain current can be calculated by repeated simulations of the bias circuit modified according to the change of a parameter value
A new measurement method is explained for the extraction of the source and drain series resistance o...
A novel method is presented to determine the bias-dependent series resistances and intrinsic conduct...
Abstract. Standard tools for CAD have limited modes of the sensitivity analysis: PSPICE only contain...
Circuit sensitivity analysis helps a circuit designer to determine which transistors in a circuit ar...
Circuit sensitivity analysis helps a circuit designer to determine which transistors in a circuit ar...
The paper presents an efficient technique for evaluating the DC sensitivity of GaAs monopolar or bip...
To conduct analyses of variability of threshold voltage (Vth) in FinFETs whose structures are based ...
A simulation model for embedding the bias of a transistor is presented. The model exploits the simul...
In this paper the sensitivity of FinFETs AC performances vs. variations of various physical paramete...
Electric simulation allows one to replace real-circuit measurements by computer-aided circuit simula...
An accurate model of MESFETs and HEMTs composed of a dc section and a multibias linear dynamic part...
The design of transistor circuits with bias stability of a specified tolerance is a complicated elec...
A detailed numerical analysis of the source and drain parasitic resistances and effective channel le...
In this brief, extraction methods are proposed for determining the essential parameters of double ga...
International audienceThe paper presents an improvement of sensitivity and tolerance analysis method...
A new measurement method is explained for the extraction of the source and drain series resistance o...
A novel method is presented to determine the bias-dependent series resistances and intrinsic conduct...
Abstract. Standard tools for CAD have limited modes of the sensitivity analysis: PSPICE only contain...
Circuit sensitivity analysis helps a circuit designer to determine which transistors in a circuit ar...
Circuit sensitivity analysis helps a circuit designer to determine which transistors in a circuit ar...
The paper presents an efficient technique for evaluating the DC sensitivity of GaAs monopolar or bip...
To conduct analyses of variability of threshold voltage (Vth) in FinFETs whose structures are based ...
A simulation model for embedding the bias of a transistor is presented. The model exploits the simul...
In this paper the sensitivity of FinFETs AC performances vs. variations of various physical paramete...
Electric simulation allows one to replace real-circuit measurements by computer-aided circuit simula...
An accurate model of MESFETs and HEMTs composed of a dc section and a multibias linear dynamic part...
The design of transistor circuits with bias stability of a specified tolerance is a complicated elec...
A detailed numerical analysis of the source and drain parasitic resistances and effective channel le...
In this brief, extraction methods are proposed for determining the essential parameters of double ga...
International audienceThe paper presents an improvement of sensitivity and tolerance analysis method...
A new measurement method is explained for the extraction of the source and drain series resistance o...
A novel method is presented to determine the bias-dependent series resistances and intrinsic conduct...
Abstract. Standard tools for CAD have limited modes of the sensitivity analysis: PSPICE only contain...